Stacked Semiconductor Package With Patterned Chip Interconnects

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Solution Overview

Problem

Conventional semiconductor packages with stacked semiconductor chips face thickness and manufacturing complexity issues due to wire bonding, necessitating a more efficient electrical connection method.

Innovation Solution

A semiconductor package design that connects stacked semiconductor chips through conductive patterns formed by patterning, allowing for a zig-zag stacking configuration and eliminating the need for wire bonding.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If wire bonding is used to establish electrical connections between stacked semiconductor chips and package substrate, then electrical connectivity is achieved, but package thickness increases and manufacturing process complexity increases

Engineering Contradiction:
Improveelectrical connectivityVSAvoidpackage thickness
Core Design Contradiction:
ReliabilityVSLength of stationary object

Solution Approach 1:

The patent transitions from three-dimensional wire bonding (requiring wire loops to reach from chip to substrate) to two-dimensional planar conductive patterns that extend laterally along chip surfaces and substrate, eliminating the need for vertical wire traversal and reducing package thickness

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent extracts and eliminates the wire bonding process entirely, replacing it with integrated conductive patterns that are formed through patterning processes directly on the chip and substrate surfaces, removing the intermediate wire connection layer

Inventive Principle:
Principle #2Taking out (Extraction)

2Reliability

If wire bonding is used to establish electrical connections between stacked semiconductor chips and package substrate, then electrical connectivity is achieved, but manufacturing process complexity increases

Engineering Contradiction:
Improveelectrical connectivityVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the electrical connection function into the existing patterning and fabrication processes of the semiconductor chips and package substrate, eliminating the need for separate wire bonding equipment and process steps

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent replaces the mechanical wire bonding process (requiring wire feeders, bonding heads, and precise positioning) with photolithography-based patterning processes that are already standard in semiconductor manufacturing

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Quantity of substance

If multiple semiconductor chips are stacked to achieve larger capacity, then storage capacity increases, but package thickness increases

Engineering Contradiction:
Improvestorage capacityVSAvoidpackage thickness
Core Design Contradiction:
Quantity of substanceVSLength of stationary object

Solution Approach 1:

The patent enables more aggressive chip stacking by replacing thick wire bonds with thin planar conductive patterns, allowing chips to be positioned closer together vertically while maintaining electrical connectivity through lateral pattern extensions

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20260018554A1Semiconductor package
Publication Date: 2026.01.15 SAMSUNG ELECTRONICS CO LTD
  • US20260018554A1 patent drawing
  • US20260018554A1 patent drawing
  • US20260018554A1 patent drawing

AI summary

An example semiconductor package includes a package substrate including a first upper connection pad and a second upper connection pad on a top surface of the package substrate, a first semiconductor chip stack including a plurality of first semiconductor chips and a first chip pad, a second semiconductor chip stack including a second chip pad and a plurality of second semiconductor chips stacked in a step-like shape on the first semiconductor chip stack, a first conductive pattern extending on the first semiconductor chip and the package substrate, a first cover insulation layer covering at least a portion of the first conductive pattern, a first encapsulation member surrounding the first semiconductor chip stack and the first conductive pattern, and a second conductive pattern extending along the second semiconductor chip, the first encapsulation member, and the package substrate.