Stacked Resistance Unit Layout for Variable Chip Resistance

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Semiconductor devices with multiple resistance units require a large occupied area on a chip to achieve various resistance values, as existing methods involve complex connections among resistance units to realize desired resistance values.

Innovation Solution

The use of variable contact plugs with different numbers and sizes on overlapping wiring patterns allows for adjustable resistance values within a single resistance unit, reducing the overall chip area by switching the number and presence of contact plugs during manufacturing, and connecting multiple resistance units in series or parallel configurations to fine-tune the device's resistance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple resistance units are used to achieve various resistance values, then the desired resistance values can be realized, but the occupied area on the chip increases

Engineering Contradiction:
Improveresistance value variabilityVSAvoidchip occupied area
Core Design Contradiction:
Adaptability or versatilityVSArea of stationary object

Solution Approach 1:

Multiple resistance units are merged into a single integrated structure where first and second resistance elements are formed in a first wiring layer and connected via contact holes to third and fourth resistance elements in a second wiring layer. This consolidation achieves multiple resistance values while reducing the number of discrete units and overall chip area.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent transitions from planar resistance units to a three-dimensional stacked configuration by forming resistance elements in multiple wiring layers (first and second wiring layers) connected through vertical contact holes. This vertical stacking enables multiple resistance values without proportionally increasing horizontal chip area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Adaptability or versatility

If the number of resistance units is increased to achieve many resistance values, then more resistance values can be realized, but the device complexity increases

Engineering Contradiction:
Improvenumber of resistance valuesVSAvoidconnecting relations among resistance units
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The resistance device is segmented into distinct modular units: first and second resistance elements in the first wiring layer, and third and fourth resistance elements in the second wiring layer, connected through contact holes. This modular segmentation allows systematic configuration of multiple resistance values while maintaining manageable structural complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The integrated resistance unit structure serves multiple functions simultaneously: it provides multiple discrete resistance values, enables selective connection through contact holes, and allows configuration in series or parallel arrangements. This multi-functionality reduces the need for separate dedicated structures for each resistance value.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20240379542A1Semiconductor device having resistance units
Publication Date: 2024.11.14 MICRON TECHNOLOGY INC
  • US20240379542A1 patent drawing
  • US20240379542A1 patent drawing
  • US20240379542A1 patent drawing

AI summary

An example apparatus that includes a plurality of resistance units connected to one another, each of the plurality of resistance units including first and second conductive elements in a first layer, a third conductive element in a second layer, one or more first contact plugs between the first conductive element and the third conductive element and one or more second contact plugs between the second conductive element and the third conductive element, wherein number of first and second contact plugs is different among at least some of the plurality of resistance units.