Stacked Substrate Bonding with Curvature-Based Misalignment Control

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Solution Overview

Problem

Existing stacked substrate manufacturing methods often face misalignment issues due to differences in curvature and distortion between substrates, leading to inadequate bonding and potential electrical conduction failures.

Innovation Solution

A method and apparatus that determine whether substrates satisfy a predetermined condition based on curvature information, using a bonding unit to align and bond substrates only if the condition is met, and employing correction mechanisms to adjust substrate holders and electrostatic chucks to minimize misalignment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If substrates are bonded without checking curvature conditions, then bonding process is simple and fast, but misalignment occurs between substrates

Engineering Contradiction:
Improvealignment accuracyVSAvoidbonding process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The curvature of each substrate is measured and evaluated before the bonding process to determine whether they satisfy predetermined bonding conditions. This preliminary assessment prevents misalignment by ensuring only compatible substrates are bonded, while maintaining process simplicity through automated evaluation criteria.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system measures the actual curvature of substrates, compares it against predetermined conditions, and uses this feedback to determine whether bonding should proceed. This closed-loop approach ensures alignment accuracy by preventing bonding of incompatible substrates while keeping the process automated and efficient.

Inventive Principle:
Principle #23Feedback

2Manufacturing precision

If curvature measurement and condition checking is performed, then alignment accuracy improves, but processing time increases

Engineering Contradiction:
Improvealignment accuracyVSAvoidsubstrate processing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

Curvature measurement is performed as a preliminary step before bonding, allowing quick evaluation of substrate compatibility. By establishing predetermined conditions and measuring curvature in advance, the system enables rapid decision-making about whether to proceed with bonding, minimizing delays in the overall process.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The substrate curvature measurement system automatically evaluates whether substrates meet bonding conditions without requiring manual intervention. The predetermined conditions are self-evaluated through automated measurement and comparison, reducing processing time by eliminating manual assessment steps.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures accurate alignment and bonding of substrates, reducing misalignment and improving the electrical conductivity and joining strength between substrates, thereby enhancing the quality of the stacked substrate.

Implementation Method 1

a first substrate holder 221 and a second substrate holder 223, each having a curved retaining surface 225, are used to retain the first substrate 211 and the second substrate 213, respectively

Methodology Applied
Scientific EffectElectrostatic attraction: Electrostatics

Data Source

PatentUS11842905B2Stacked substrate manufacturing method, stacked substrate manufacturing apparatus, stacked substrate manufacturing system, and substrate processing apparatus
Publication Date: 2023.12.12 SCREEN HOLDINGS CO LTD
  • US11842905B2 patent drawing
  • US11842905B2 patent drawing
  • US11842905B2 patent drawing

AI summary

A method of manufacturing a stacked substrate by bonding a first substrate and a second substrate, including a step of determining, based on information about curving of each of the first substrate and the second substrate, whether or not the first substrate and the second substrate satisfy a predetermined condition, and, a step of bonding the first substrate and the second substrate if the predetermined condition is satisfied. The stacked substrate manufacturing method described above includes a step of estimating, based on the information, an amount of misalignment which occurs after the first substrate is bonded to the second substrate and the predetermined condition may include that the amount of misalignment is equal to or less than a threshold.