Stacked Word Line Capacitor Layout for Dense NVM Bit Cells

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Solution Overview

Problem

Conventional semiconductor devices face challenges in increasing cell density and reducing manufacturing costs due to the need for channel region implants and the spatial requirements of word line capacitors, which limit the integration of more components per chip area.

Innovation Solution

A non-volatile memory (NVM) bit cell design with a stacked word line capacitor configuration, where the capacitive field plate is positioned over the gate and dielectric layer, eliminating the need for channel region implants and allowing for a smaller footprint, thereby increasing cell density and reducing manufacturing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If conventional semiconductor device design with separate word line capacitor and channel region implant is used, then device functionality is achieved, but cell density is limited and manufacturing cost increases

Engineering Contradiction:
Improvecell densityVSAvoidmanufacturing process complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent merges the word line capacitor and transistor into a stacked configuration where the capacitor is formed directly over the transistor structure. This integration eliminates the need for separate channel region implants and reduces the overall cell footprint, thereby increasing cell density while simplifying the manufacturing process

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent transitions from a planar layout to a three-dimensional stacked architecture. By stacking the capacitor vertically over the transistor rather than placing it laterally adjacent, the design utilizes the vertical dimension to reduce lateral footprint and increase integration density

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Area of stationary object

If word line capacitor is placed adjacent to transistor, then device functionality is achieved, but chip area increases

Engineering Contradiction:
Improvechip areaVSAvoidcell density
Core Design Contradiction:
Area of stationary objectVSQuantity of substance

Solution Approach 1:

The patent moves the capacitor from a lateral placement to a vertical stacking configuration directly over the transistor. This dimensional transition reduces the lateral area occupied by each bit cell, allowing more cells to be packed into the same chip area and thereby increasing cell density

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS12513947B2Semiconductor device and method of formation
Publication Date: 2025.12.30 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12513947B2 patent drawing
  • US12513947B2 patent drawing
  • US12513947B2 patent drawing

AI summary

A semiconductor device includes a channel region between a source region and a drain region, a gate over the channel region, a dielectric layer over the gate, a capacitive field plate over the dielectric layer, and a word line electrically coupled to the capacitive field plate.