Stage Groove for Edge Ring Arcing Prevention

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Solution Overview

Problem

In semiconductor manufacturing, arcing occurs due to potential differences between films formed on the semiconductor substrate and the edge ring, leading to interrupted batch film deposition and potential component damage.

Innovation Solution

A semiconductor manufacturing apparatus with a stage featuring a conductive annular edge ring and a groove below its inner circumferential end, which separates the film formed on the stage from the film formed on the edge ring, reducing potential differences and preventing arcing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If films are formed on both the semiconductor substrate and the edge ring during plasma generation, then film deposition is achieved, but potential differences between these films cause arcing that interrupts batch film deposition and may damage components

Engineering Contradiction:
Improvebatch film depositionVSAvoidarcing prevention
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The stage is divided into functionally distinct regions: a first region that contacts the semiconductor substrate and a second region that contacts the edge ring. These regions are electrically isolated from each other, allowing independent potential control. This segmentation prevents potential difference between substrate-contacting and edge ring-contacting surfaces, eliminating the arcing problem while maintaining continuous batch film deposition capability.

Inventive Principle:
Principle #1Segmentation

2Stability of the object's composition

If the stage contacts both the semiconductor substrate and the edge ring, then uniform plasma generation is enabled, but potential differences arise between films formed on different contacted surfaces

Engineering Contradiction:
Improveuniform plasma generationVSAvoidpotential difference
Core Design Contradiction:
Stability of the object's compositionVSObject-generated harmful factors

Solution Approach 1:

The stage is segmented into electrically isolated first and second regions. The first region contacts the semiconductor substrate while the second region contacts the edge ring. This segmentation allows each region to be at a different electrical potential, enabling uniform plasma generation across the entire chamber while preventing potential difference-induced arcing between the substrate and edge ring films.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The edge ring serves as an intermediary component between the stage and the plasma environment. By making the edge ring electrically isolated from the stage through the use of electrically insulating supports, the system mediates the plasma generation process while preventing direct electrical contact that would cause potential differences and arcing between films on the substrate and edge ring.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design allows for uniform plasma generation and prevents arcing, enabling continuous batch film deposition without damaging components.

Implementation Method 1

a film deposition apparatus that forms a conductive film on a semiconductor substrate while generating plasma

Methodology Applied
Scientific EffectPlasma: Plasma

Data Source

PatentUS11264215B2Semiconductor manufacturing apparatus
Publication Date: 2022.03.01 KIOXIA CORP
  • US11264215B2 patent drawing
  • US11264215B2 patent drawing
  • US11264215B2 patent drawing

AI summary

A semiconductor manufacturing apparatus includes: a stage configured to support a semiconductor substrate; and a conductive annular member provided at an outer circumferential portion of the stage and configured to enclose the semiconductor substrate when supported on the stage. The stage has a groove that is provided below a lower portion of an inner circumferential end of the annular member.