Staggered Grid Projection Pattern for Distance Sensor Accuracy
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Solution Overview
Problem
High-density projection patterns in distance sensors lead to complex distance calculations due to overlapping trajectories of projection artifacts, making it difficult to distinguish individual artifacts and increasing calculation time, while pattern density changes with distance, affecting measurement accuracy.
Innovation Solution
A staggered grid pattern of projection artifacts with a defined pattern density parameter, where the spacing between rows and columns adjusts based on the trajectory length, allowing for increased pattern density without overlapping, facilitating more accurate distance calculations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high-density projection patterns are used, then measurement resolution and accuracy are improved, but calculation complexity increases and individual artifacts become difficult to distinguish
Solution Approach 1:
The projection pattern is segmented into multiple non-overlapping trajectories, where each trajectory contains a sequence of projection artifacts. This segmentation allows the system to maintain high pattern density while providing clear separation between trajectories, making it easier to distinguish and process individual artifacts during calculation.
Solution Approach 2:
The system performs preliminary organization of projection artifacts into structured trajectories with defined spacing relationships before distance calculation. The staggered grid pattern pre-establishes the spatial relationships and spacing between artifacts, so that when images are captured at different distances, the artifacts maintain distinguishable positions that simplify subsequent calculation processes.
2Measurement precision
If pattern density increases with trajectory length, then measurement accuracy is improved, but overlapping of projection artifacts occurs
Solution Approach 1:
The projection pattern implements local quality variation through its staggered grid structure, where the spacing between adjacent trajectories is carefully controlled to be greater than the artifact diameter. This creates local non-overlapping zones within each trajectory while maintaining high overall pattern density, ensuring that artifacts remain distinguishable even as pattern density increases with trajectory length.
Solution Approach 2:
The staggered arrangement of trajectories creates an asymmetric pattern where rows are offset from each other. This asymmetric configuration optimizes the spatial distribution of artifacts, allowing the pattern to achieve high density along the trajectory length while maintaining sufficient separation between adjacent trajectories to prevent overlapping.
3Device complexity
If staggered grid pattern with adjusted spacing is used, then calculation complexity is reduced, but pattern design complexity increases
Solution Approach 1:
The projection system dynamically adjusts the spacing between rows and columns of the staggered grid pattern based on the desired trajectory length and artifact diameter. This dynamic configuration allows the system to optimize the balance between pattern density and artifact separation for different measurement scenarios, reducing calculation complexity while managing design complexity through parameter adjustment rather than fixed rigid structures.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The staggered grid pattern enhances measurement resolution and accuracy by maintaining pattern density while reducing calculation complexity, enabling precise distance determination regardless of object distance.
Implementation Method 1
projection systems (e.g., comprising lasers, diffractive optical elements, and/or other cooperating components) which project beams of light
Implementation Method 2
When the pattern is incident upon an object in the field of view, the distance from the sensor to the object can be calculated based on the appearance of the pattern
Data Source
AI summary
An example method includes causing a light projecting system of a distance sensor to project a pattern of light onto an object. The pattern of light includes a plurality projection artifacts arranged in a grid. Rows and columns of the grid are arranged in a staggered manner. Spacing between the rows and spacing between the columns is set so that a pattern density parameter of the pattern of light increases with a length of a trajectory of the projection artifacts. The pattern density parameter is defined as a ratio between a maximum diameter of the projection artifacts and the length of the trajectory. The method further includes causing a light receiving system of the distance sensor to acquire an image of the pattern of light projected onto the object, and computing a distance from the object to the distance sensor based on locations of the projection artifacts in the image.