Staggered Reflectors for Super-Resolved Imaging Beyond Diffraction

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Solution Overview

Problem

Conventional imaging systems are limited by the diffraction barrier, which restricts their spatial resolution, preventing them from distinguishing between two closely spaced points that would otherwise be resolved if light reflecting directly from the sample were used.

Innovation Solution

The implementation of an imaging system that uses a set of reflectors staggered in depth beneath the sample, allowing light to reflect from these reflectors and be measured at different times by an ultrafast light sensor, enabling the system to computationally combine these measurements for spatially super-resolved images beyond the diffraction limit.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional imaging optics are used, then the system is simple and easy to operate, but the spatial resolution is limited by the diffraction barrier

Engineering Contradiction:
Improvespatial resolutionVSAvoidimaging system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces reflectors as intermediary objects beneath the sample that reflect light back through the sample to the detector. These reflectors act as mediators that enable the ultrafast sensor to temporally resolve light paths, thereby achieving super-resolution without requiring complex optical modifications to the imaging system itself

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent adds the time dimension to the traditional spatial imaging problem. By using ultrafast temporal resolution to distinguish light that has traveled different path lengths (through the sample and reflected), the system converts a spatial resolution problem into a temporal measurement problem, achieving super-resolution in space through measurements in time

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If light reflects directly from the sample, then the imaging process is simple, but closely spaced points cannot be distinguished due to diffraction

Engineering Contradiction:
Improvespatial resolutionVSAvoidinformation about closely spaced features
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent segments the light reflection process by introducing multiple reflectors at different depths beneath the sample. Each reflector creates a distinct temporal signature in the reflected light, allowing the system to segment and separately measure information from different spatial locations that would otherwise be indistinguishable

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system uses periodic pulsed illumination combined with temporal gating to selectively measure light reflected from different depths. By synchronizing the detection window with the expected arrival time of reflected light from specific reflectors, the system periodically samples different spatial information, accumulating super-resolved data over multiple cycles

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for improved spatial resolution by temporally resolving light reflections from staggered reflectors, effectively bypassing the diffraction barrier and enabling the imaging of closely spaced features that would otherwise be indistinguishable.

Implementation Method 1

light reflecting back from the reflectors arrives at a light sensor during a different time interval for each reflector

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 2

the reflectors and ultrafast time resolution allow the imaging system to work around the diffraction barrier

Methodology Applied
Scientific EffectTime of flight: Time of Flight

Data Source

PatentUS11016309B2Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample
Publication Date: 2021.05.25 MASSACHUSETTS INST OF TECH
  • US11016309B2 patent drawing
  • US11016309B2 patent drawing
  • US11016309B2 patent drawing

AI summary

A sample may be illuminated in such a way that light passes through the sample, reflects from a set of reflectors, passes through the sample again and travels to a light sensor. The reflectors may be staggered in depth beneath the sample, each reflector being at a different depth. Light reflecting from each reflector, respectively, may arrive at the light sensor during a different time interval than that in which light reflecting from other reflectors arrives—or may have a different phase than that of light reflecting from the other reflectors. The light sensor may separately measure light reflecting from each reflector, respectively. The reflectors may be extremely small, and the separate reflections from the different reflectors may be combined in a super-resolved image. The super-resolved image may have a spatial resolution that is better than that indicated by the diffraction limit.