Staircase Conductive Line Contacts for Dense 3D Memory Interconnects

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional memory devices face challenges in interconnection density and spatial constraints due to traditional conductive line geometries, particularly in 3D DRAM arrays, where coupling conductive lines to sense amplifiers or word line drivers results in increased interconnection area and fabrication complexity.

Innovation Solution

The implementation of multi-direction conductive lines and staircase conductive line contact structures, which allow for more efficient interconnection by forming vertically stacked memory cells with horizontally oriented access devices and vertically oriented access lines, reducing spatial requirements and enhancing interconnection density.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If traditional conductive line geometries are used in 3D DRAM arrays, then the fabrication process is simpler, but the interconnection density is lower and spatial occupancy is increased

Engineering Contradiction:
Improveinterconnection densityVSAvoidspatial occupancy
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The patent transitions from planar 2D conductive line geometries to three-dimensional staircased geometries that utilize vertical stacking. Conductive lines are arranged in multiple tiers at different heights, with interconnections forming staircase patterns that extend in both horizontal and vertical dimensions. This dimensional transition enables significantly higher interconnection density within the same footprint area while reducing spatial occupancy through efficient vertical space utilization.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The staircased conductive line structure implements a nested arrangement where multiple conductive lines at different tiers are vertically stacked and interconnected. Lower-tier conductive lines are positioned beneath upper-tier lines, creating a nested configuration that maximizes the use of vertical space. This nesting approach allows multiple interconnections to be packed into a compact volume, thereby increasing interconnection density without proportionally increasing spatial occupancy.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Quantity of substance

If traditional conductive line geometries are used, then the structure is easier to fabricate, but the interconnection density is reduced

Engineering Contradiction:
Improveinterconnection densityVSAvoidfabrication complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The complex three-dimensional staircased conductive line structure is fabricated through segmented processing steps. The fabrication is divided into multiple discrete stages, with each stage forming a specific tier or segment of the overall structure. Conductive lines are formed in sequential layers, with each layer being patterned and deposited independently before the next layer is added. This segmentation of the fabrication process makes the complex 3D structure achievable through manageable, repeatable processing steps.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The fabrication process employs preliminary actions by first forming the lower-tier conductive lines and their supporting structures before adding upper tiers. Each tier is prepared and positioned in advance before being integrated with subsequent tiers. This preliminary formation of individual staircased segments allows for precise control of each layer's geometry and facilitates the systematic building of the complete three-dimensional interconnection structure.

Inventive Principle:
Principle #10Preliminary action

3Quantity of substance

If multi-direction conductive lines and staircase structures are implemented, then interconnection density increases, but fabrication complexity increases

Engineering Contradiction:
Improveinterconnection densityVSAvoidfabrication process complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The staircased conductive line structure serves multiple functions simultaneously: it provides electrical interconnections between different tiers, establishes mechanical support for upper layers, defines routing paths for multiple signal lines, and creates compact packaging. This multi-functionality reduces the need for separate dedicated structures for each function, thereby achieving high interconnection density without a proportional increase in fabrication process complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges multiple fabrication operations into integrated processing steps. For example, the formation of conductive lines, dielectric layers, and interconnection vias is combined into unified deposition and patterning sequences. The staircased structure itself merges vertical and horizontal interconnections into a single integrated geometry, eliminating the need for separate vertical and horizontal routing structures and simplifying the overall fabrication approach.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20240147693A1Conductive line contact regions having multiple multi-direction conductive lines and staircase conductive line contact structures for semiconductor devices
Publication Date: 2024.05.02 MICRON TECHNOLOGY INC
  • US20240147693A1 patent drawing
  • US20240147693A1 patent drawing
  • US20240147693A1 patent drawing

AI summary

Systems, methods, and apparatus including conductive line contact regions having multiple multi-direction conductive lines and staircase conductive line contact structures for semiconductor devices. One memory device comprises arrays of vertically stacked memory cells, having multiple multi-direction conductive lines arrays of vertically stacked memory cells, including a vertical stack of layers formed from repeating iterations of a group of layers, the group of layers comprising: a first dielectric material layer, a semiconductor material layer, and a second dielectric material layer, the second dielectric material layer having a conductive line formed in a horizontal plane therein, and the vertical stack of layers having multiple multi-direction conductive lines in an interconnection region with a first portion of the interconnection region formed in an array region and a second portion formed in a conductive line contact region that is spaced from the array region.