Staircase Semiconductor Stacked Body Insulating Film

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

In semiconductor memory devices with three-dimensional structures, the increase in the number of stacked electrode films leads to poor reliability due to contact punch-through issues in shallow holes, causing short circuits and misalignment of contact holes in the staircase-shaped end parts of the stacked body.

Innovation Solution

The semiconductor device incorporates an insulating film 50 with an inclination extending along the staircase-shaped end part of the stacked body, which functions as a film to stop etching and prevent punch-through, ensuring reliable contact formation by maintaining a consistent etching selection ratio and preventing misalignment of contact holes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the number of stacked electrode films is increased to achieve higher integration, then the memory capacity is improved, but contact punch-through occurs in shallow holes causing poor reliability

Engineering Contradiction:
Improvenumber of stacked electrode filmsVSAvoidcontact reliability
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent divides the end part of the stacked body into multiple terraces at different heights, with each terrace corresponding to a specific electrode film. This segmentation allows contacts to be formed at different vertical positions, preventing punch-through by ensuring that contacts to upper electrode films do not extend too deeply and cause short circuits to lower electrode films.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a vertical height dimension to the end part structure by creating a staircase configuration with multiple terraces at different heights. This dimensional change allows the contact holes to be naturally depth-limited by the terrace structure, solving the punch-through problem without requiring additional process steps or materials.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of manufacture

If the end part is processed into a staircase shape to enable contact formation, then electrode extraction is facilitated, but contact holes may misalign or punch through causing short circuits

Engineering Contradiction:
Improvecontact formation easeVSAvoidcontact hole alignment
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The staircase structure with terraces is formed beforehand before contact hole formation. This preliminary action creates pre-defined stopping points at each terrace level, which guide the etching process and ensure that contact holes automatically stop at the correct depth without requiring complex control mechanisms, thereby preventing misalignment and punch-through.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The terrace structure acts as an intermediary element between the stacked body and the contact holes. It provides a physical reference level that mediates the etching process, ensuring that contact holes are formed at the correct depth and position without requiring additional alignment marks or complex process control.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS10529733B2Semiconductor device and method for manufacturing the same
Publication Date: 2020.01.07 KIOXIA CORP
  • US10529733B2 patent drawing
  • US10529733B2 patent drawing
  • US10529733B2 patent drawing

AI summary

According to an embodiment, a semiconductor device includes a substrate, a stacked body, a first insulating film, a second insulating film and a plurality of contacts. The stacked body is provided on the substrate and includes a plurality of electrode films stacked with spacing from each other. An end part of the stacked body is shaped like a staircase in which a terrace is formed in each of the plurality of electrode films. The first insulating film is provided on the end part. The second insulating film is provided on the first insulating film and located along the end part. At least part of the second insulating film extends with inclination. The plurality of contacts extends in a stacking direction of the plurality of electrode films in the first insulating film and the second insulating film and is located on the terraces of the plurality of electrode films.