Standard Cell Fin Layout Around Power Rail Boundaries

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Solution Overview

Problem

The increasing demand for high-performance, high-speed, and multifunctional semiconductor devices has led to challenges in achieving improved integration density and reliability, particularly in the design and manufacturing processes of semiconductor devices.

Innovation Solution

The semiconductor device incorporates a substrate with specific arrangements of standard cells and power supply lines, including active fins and power supply lines that extend along boundaries between row regions, with active fins spaced apart to avoid overlapping these boundaries, and the use of dummy fins to enhance design flexibility and integration density.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If active fins are arranged densely to increase integration density, then integration density is improved, but reliability deteriorates due to potential overlapping with power supply lines and increased manufacturing complexity

Engineering Contradiction:
Improveintegration densityVSAvoiddevice reliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The active region is divided into multiple row regions separated by boundaries, with power supply lines positioned along these boundaries. Active fins within each row region are spaced to avoid overlapping boundaries, creating segmented zones that maintain both high density and reliability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different spacing requirements are applied to active fins based on their local position: fins near boundaries are spaced farther apart to avoid overlapping power supply lines, while fins in the center of row regions can be more densely packed, optimizing both reliability and integration density locally.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If power supply lines are positioned along boundaries between row regions, then manufacturing precision is improved by simplifying alignment, but device complexity increases due to the need for precise boundary definition

Engineering Contradiction:
Improvealignment precisionVSAvoidlayout complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The boundaries between row regions serve multiple functions: they define the edges of active fin arrangements, position power supply lines, and act as reference lines for manufacturing alignment. This multi-functionality simplifies the manufacturing process while maintaining precise positioning.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If active fins are spaced apart to avoid overlapping boundaries, then reliability is improved, but area utilization deteriorates reducing integration density

Engineering Contradiction:
Improvedevice reliabilityVSAvoidarea utilization
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

Active fins are spaced apart only in the regions necessary to avoid overlapping power supply lines at boundaries, while maintaining maximum density in the central regions of each row. This partial application of spacing ensures reliability without excessive loss of area utilization.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS12361193B2Semiconductor device and method of manufacturing the same
Publication Date: 2025.07.15 SAMSUNG ELECTRONICS CO LTD
  • US12361193B2 patent drawing
  • US12361193B2 patent drawing
  • US12361193B2 patent drawing

AI summary

A semiconductor device includes a substrate having an active region, first standard cells arranged in a first row on the active region, second standard cells arranged in a second row on the active region and having a first boundary with the first standard cells, a third standard cells arranged in a third row on the active region and having a second boundary with the first standard cells, and a plurality of power supply lines, respectively arranged along boundaries. Each of the first to third standard cells includes a plurality of fin patterns extending in the first direction, and the plurality of fin patterns are arranged in a second direction, so as not to be disposed on at least one boundary, among the first and second boundaries.