Standard Cell Layout Offsets for Grid Mismatch and Routing Congestion
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Solution Overview
Problem
The reduction in device sizes in semiconductor processes leads to inefficiencies in integrated circuits due to grid mismatch and increased congestion, affecting the performance and efficiency of standard cells.
Innovation Solution
The integrated circuit design includes standard cells with varying grid offsets and multi-patterning techniques to optimize layout, reducing grid mismatch and congestion, and improving performance by selecting appropriate cells with different grid offsets during the design process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If standard cells are arranged to comply with various fabrication process requirements, then manufacturing precision is improved, but area efficiency deteriorates
Solution Approach 1:
The patent segments the integrated circuit into multiple function cells (first function cell, second function cell, etc.), each with different grid offset configurations. This segmentation allows different regions to be optimized for different requirements, enabling some cells to prioritize manufacturing precision while others maximize area efficiency, thus resolving the contradiction between compliance and area utilization.
Solution Approach 2:
The patent applies local quality by assigning different grid offset characteristics to different function cells. Specifically, the first function cell has a first grid offset while the second function cell has a second grid offset different from the first. This local differentiation allows each cell to be optimized for its specific function and placement requirements, enabling the overall circuit to achieve both manufacturing precision compliance and high area efficiency.
2Quantity of substance
If device sizes are reduced in semiconductor process, then integration density is improved, but grid mismatch and routing congestion increase
Solution Approach 1:
The patent introduces dynamic grid offset adjustment across different function cells. Rather than using a fixed uniform grid throughout the integrated circuit, the grid offset varies from cell to cell (first offset in first function cell, second offset in second function cell). This dynamic approach allows the routing structure to adapt to the reduced device sizes and prevent congestion, maintaining routing efficiency even as integration density increases.
Solution Approach 2:
The patent changes the grid offset parameter across different function cells to optimize performance at reduced device sizes. By varying the grid offset parameter (from first offset to second offset), the patent enables better spacing and routing arrangements that prevent congestion and grid mismatch issues that typically arise when device sizes are reduced, thus maintaining low device complexity despite high integration density.
Data Source
AI summary
An integrated circuit may include a first function cell and a second function cell each corresponding to a first circuit, wherein the first function cell may include a first pattern extending in a first direction along a first grid in a first layer and a second pattern extending in the first direction along a second grid in a second layer, the first grid may have a first pitch greater than a second pitch of the second grid in a second direction crossing the first direction, and the second function cell may include a layout of the first function cell and have a length greater than a length of the first function cell by the first pitch in the second direction.