Standard Cell Source Edge Abutment for Chip Area Optimization

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Solution Overview

Problem

In integrated circuit design, the use of filler cells to separate standard cells results in wastage of chip area due to the inability to abut certain types of standard cells, leading to inefficient layout and routing.

Innovation Solution

The design scheme allows for standard cells with specific edge configurations, including source and drain edges, where source edges can abut each other, eliminating the need for filler cells by merging dummy gates (PODEs) and aligning power supply voltages, thereby optimizing chip area usage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If filler cells are inserted between standard cells to separate them, then the reliability of cell separation is improved, but the chip area is wasted

Engineering Contradiction:
Improvecell separationVSAvoidchip area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent extracts and removes the filler cells from the standard cell layout. By eliminating the filler cells that were previously inserted between standard cells for separation, the invention achieves both cell separation through direct abutting and maximizes chip area utilization without wasted space.

Inventive Principle:
Principle #2Taking out (Extraction)

2Area of stationary object

If standard cells are placed as parallel rows with abutted edges, then the chip area utilization is improved, but the manufacturing complexity increases due to alignment requirements

Engineering Contradiction:
Improvechip area utilizationVSAvoidalignment complexity
Core Design Contradiction:
Area of stationary objectVSEase of manufacture

Solution Approach 1:

The patent segments the standard cell edges into source edges and non-source edges, with specific orientation requirements. By dividing the cell boundaries into functionally distinct segments and prescribing their orientations, the invention enables straightforward abutting placement that simplifies manufacturing alignment while maximizing chip area utilization.

Inventive Principle:
Principle #1Segmentation

3Ease of operation

If source edges of all standard cells are oriented to face the same direction, then the ease of placement and routing is improved, but the adaptability to different cell types is reduced

Engineering Contradiction:
Improveplacement and routingVSAvoidcell type compatibility
Core Design Contradiction:
Ease of operationVSAdaptability or versatility

Solution Approach 1:

The patent establishes universal orientation rules for source edges that apply across all standard cell types. By defining that source edges must face the same direction regardless of cell type, the invention creates a unified placement and routing framework that simplifies operations while maintaining adaptability through the consistent application of the rule to diverse cell types.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS8847284B2Integrated circuit with standard cells
Publication Date: 2014.09.30 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US8847284B2 patent drawing
  • US8847284B2 patent drawing
  • US8847284B2 patent drawing

AI summary

A die includes a plurality of rows of standard cells. Each of all standard cells in the plurality of rows of standard cells includes a transistor and a source edge, wherein a source region of the transistor is adjacent to the source edge. No drain region of any transistor in the each of all standard cells is adjacent to the source region.