Mapping State Elements via Sequential Depth for Equivalence Verification
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Solution Overview
Problem
Conventional equivalence verification methods for digital circuits face challenges such as name alterations during design transformations, difficulty in reverse engineering, and circular problems due to incomplete input information, making them inefficient for mapping state elements across different design levels.
Innovation Solution
The method involves determining sequential depths from primary inputs and outputs to state elements in digital circuits, identifying and mapping state elements with unique sequential depths, and iteratively refining these mappings using feature vectors to ensure accurate equivalence verification.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a naming method is used to map state elements, then the mapping process is simple, but the method becomes unusable when names are altered or lost during design transformation
Solution Approach 1:
The patent changes the mapping parameters from element names to structural characteristics (sequential depth, fan-in logic cone structure). This allows the mapping to remain valid even when names are altered during design transformation, as the structural parameters remain invariant across transformation levels.
Solution Approach 2:
The patent introduces structural characteristics as intermediary parameters that mediate between the high-level and low-level designs. These structural features serve as a common language that both design levels can use for mapping, even when direct name correspondence is lost.
2Reliability
If a functional method using canonical representation is used, then the mapping can handle name changes, but it creates a circular problem by requiring all inputs to be mapped
Solution Approach 1:
The patent segments the mapping problem into independent components based on sequential depth levels. By dividing the state elements into distinct depth groups, the mapping can proceed independently for each segment without requiring global knowledge of all inputs, thereby breaking the circular dependency.
Solution Approach 2:
The patent performs preliminary classification of state elements by sequential depth before attempting mapping. This preliminary action organizes the elements in a way that eliminates the need for simultaneous mapping of all inputs, allowing the process to proceed systematically from one depth level to the next.
3Adaptability or versatility
If a simulation method is used to match state elements, then the method can handle design variations, but it becomes difficult to use in the presence of modifications
Solution Approach 1:
The patent changes from simulation-based matching to structural parameter-based matching. By using invariant structural parameters like sequential depth and fan-in logic cone structure, the method maintains adaptability to design variations while improving ease of operation, as these parameters can be directly extracted without complex simulation.
4Measurement precision
If a structural method performing net-list to net-list comparison is used, then the method examines combinational cone structure, but it has shortfalls in mapping state elements
Solution Approach 1:
The patent adds the dimension of sequential depth to the traditional structural comparison method. While conventional structural methods only examine combinational logic, this patent incorporates the temporal dimension of sequential depth, enabling more effective state element mapping by considering both structural and temporal characteristics.
Data Source
AI summary
Systems and methods for mapping state elements of digital circuits for equivalence verification are provided. One method for mapping state elements for equivalence verification between a first circuit and a second circuit includes (a) determining a first sequential depth from primary inputs and primary outputs of the first circuit and the second circuit to each state element thereof, wherein the first sequential depth is a minimum count of state elements along any path between two points of a circuit, (b) identifying and mapping first state elements of the first circuit and the second circuit having a unique first sequential depth, (c) determining a second sequential depth from the identified first state elements of the first circuit and the second circuit to the remaining state elements, (d) identifying second state elements of the first circuit and the second circuit having a unique second sequential depth, and (e) repeating (c) and (d) unless the process is no longer generating new unique mappings of state elements.


