State-Retention Flip-Flop With Double Sampling for Data Integrity
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Solution Overview
Problem
Flip-flop circuits face data loss during power down due to lack of effective state retention and insufficient data resilience, especially with technology scaling causing process margin issues.
Innovation Solution
A flip-flop circuit design incorporating a master latch, slave latch, dual-function circuit for state retention and double sampling, power management unit, and clock generation unit, which includes a balloon latch for state retention and shadow latch for double sampling, along with switch circuits and control circuits to manage clock signals and error detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional flip-flop circuits are used without state retention mechanisms, then the circuit structure remains simple, but data loss occurs during power down
Solution Approach 1:
The flip-flop circuit is divided into two independent latches: a master latch for normal operation and a balloon latch for state retention. This segmentation allows the retention function to be added without fundamentally redesigning the entire circuit, maintaining relative simplicity while achieving data preservation during power down
Solution Approach 2:
The balloon latch acts as an intermediary storage element between the master latch and external memory. It temporarily holds the state information during power down periods and transfers it back when power is restored, preventing direct data loss without requiring complex external storage management
2Reliability
If single sampling is used in flip-flop circuits, then the circuit operation is simple, but data resilience is insufficient due to process margin issues
Solution Approach 1:
The shadow latch performs a preliminary sampling of the data before the final latching operation. By capturing the data state in advance with appropriate timing margins, it provides a backup sample that can be used to correct errors or verify data integrity, enhancing resilience against process variations
Solution Approach 2:
The circuit incorporates feedback mechanisms where the shadow latch output is compared with the master latch output. This feedback allows error detection and correction, ensuring data resilience by verifying that the sampled data matches expected values and compensating for process margin issues
3Measurement precision
If no error detection mechanism is implemented, then the circuit remains simple, but data integrity cannot be ensured
Solution Approach 1:
Error detection logic continuously monitors the relationship between master latch and shadow latch outputs. When discrepancies are detected, feedback signals trigger corrective actions or flag errors, ensuring data integrity through automated verification without requiring complex external testing equipment
Data Source
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AI summary
Embodiments of a device and method are disclosed. In an embodiment, a flip-flop circuit is disclosed. The flip-flop circuit includes a master latch, a slave latch connected to the master latch, and a dual-function circuit connected between the master latch and the slave latch and configured to perform state retention and double sampling.