Statistical Design Rule Checking for IC Yield Optimization
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Solution Overview
Problem
Current design rules for integrated circuits are inflexible and do not allow designers to adjust or assess the impact of modifying these rules, which limits the ability to optimize chip performance and yield based on specific chip characteristics and requirements.
Innovation Solution
A system and method that enable Integrated Circuit designers to alter design rules and calculate the probability of success for each circuit component, allowing for flexible rule settings across different portions of the chip, thereby determining the overall probability of the IC design working.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If design rules are made conservative to ensure yield, then reliability is improved, but adaptability deteriorates
Solution Approach 1:
The patent implements dynamic design rules that can be adjusted based on specific chip requirements and characteristics. Instead of using fixed conservative rules, the system allows designers to modify design parameters (such as minimum wire width, spacing, via dimensions) according to the particular chip design needs, while still maintaining statistical control over yield through probability calculations.
Solution Approach 2:
The patent enables parameter changes in design rules by allowing statisticians and designers to modify specific design parameters (width, length, spacing) based on lithography process capabilities and chip requirements. The system calculates probability of success for different parameter values, enabling data-driven optimization of both reliability and adaptability.
2Adaptability or versatility
If design rules are made less conservative to improve performance, then adaptability is improved, but reliability deteriorates
Solution Approach 1:
The patent incorporates feedback mechanisms through probability calculations that show designers the expected yield impact of proposed design rule changes. The system provides feedback in the form of statistical predictions about how relaxed design rules will affect chip success probability, allowing designers to make informed decisions about the balance between performance optimization and yield maintenance.
Solution Approach 2:
The system allows parameter changes in design rules with quantitative assessment of consequences. Designers can modify parameters to improve adaptability and performance, while the system simultaneously calculates the probability of success to assess the reliability impact, enabling balanced optimization.
3Manufacturing precision
If design rules are strictly enforced, then manufacturing precision is improved, but ease of operation deteriorates
Solution Approach 1:
The patent implements self-service functionality where the system automatically calculates probability of success for design rule modifications without requiring manual intervention from designers or statisticians for each calculation. The system serves itself by providing automated statistical assessments that designers can use to make informed decisions about rule flexibility.
Solution Approach 2:
The system provides automated feedback to designers showing the expected manufacturing precision outcomes and yield implications of proposed design rule changes. This feedback mechanism helps designers understand the trade-offs between relaxed design rules and manufacturing precision requirements.
Data Source
AI summary
Methods and systems for allowing an Integrated Circuit designer to specify one or more design rules, and to determine the expected probability of success of the IC design based on the design rules. Probability information is compiled for each circuit component, that specifies the probability of the circuit component working if a characteristic of the circuit component is varied. As the design rules are examined, the probability of each component working is calculated. The probabilities are combined to determine the overall probability of success for the IC design. Furthermore, the IC design may be broken into a plurality of portions, and design rules can be separately specified for each portion. This allows a designer the flexibility to use different design rules on different portions of the IC design.