Scalable Statistical Library Characterization for Electronic Designs

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Solution Overview

Problem

Current methods for statistical library characterization in electronic design are computationally intensive and degrade with increasing complexity, requiring extensive resources and time due to super-linear simulation time increases with the number of transistors and process parameters.

Innovation Solution

The method involves performing simulations and sensitivity analysis on strongly connected components individually, ignoring unrelated circuit components and capacitive load variations, and using simplified models to combine parameter influences, allowing for scalable and efficient characterization.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If statistical library characterization is performed using finite difference method with increased cell design complexity and process parameters, then characterization accuracy is improved, but computation time and resource requirements increase super-linearly

Engineering Contradiction:
Improvecharacterization accuracyVSAvoidcomputation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent divides the electronic design into strongly connected components (SCCs) and performs simulations on each component separately rather than on the entire design. This segmentation approach reduces the simulation complexity from O(N^2×P) to O(N×P) by isolating and analyzing individual components, thereby maintaining characterization accuracy while significantly reducing computation time.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent extracts and analyzes only the strongly connected components that are relevant to the timing sensitivity analysis, excluding unrelated circuit components from the simulation. This extraction approach allows the system to focus computational resources on the critical paths and components that directly impact timing characteristics, reducing overall computation time while preserving characterization accuracy.

Inventive Principle:
Principle #2Taking out (Extraction)

2Reliability

If simulations are performed on all circuit components including feedback paths, then characterization completeness is improved, but simulation complexity and time increase

Engineering Contradiction:
Improvecharacterization completenessVSAvoidsimulation complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the circuit into strongly connected components and processes each component independently. By breaking down the complex feedback-rich circuit into manageable SCCs, the system maintains complete characterization of timing sensitivity while reducing simulation complexity. Each SCC can be simulated without needing to simultaneously analyze the entire circuit.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs simulations on strongly connected components that are necessary for timing analysis, selectively excluding components that do not contribute to timing sensitivity. This partial action approach maintains sufficient characterization completeness for timing-critical paths while avoiding the excessive computational burden of simulating all components including unrelated feedback paths.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS9594858B1Methods, systems, and articles of manufacture for implementing scalable statistical library characterization for electronic designs
Publication Date: 2017.03.14 CADENCE DESIGN SYST INC
  • US9594858B1 patent drawing
  • US9594858B1 patent drawing
  • US9594858B1 patent drawing

AI summary

Various embodiments scalable statistical library characterization for electronic designs by identifying an electronic design, performing circuit simulations on strongly connected components on a component-by-component basis, performing the logic cone analysis on the entire electronic design, and performing combinations of influences on the electronic design caused by variations of parameters. Some embodiments perform simulations on one or more stronger parameters or the strongest parameter of a circuit component and use the simulation results to calibrate the predicted behaviors of one or more remaining circuit components of the electronic design. Various statistical or mathematical techniques may be used for performing the combinations of influences on the electronic design caused by variations of parameters. The techniques described are scalable with the increase in complexities and sizes of electronic designs while reducing or minimizing the impact on sensitivity accuracy.