Inert Gas Supply for STB in Semiconductor Wafer Production

Solution Overview

Problem

Semiconductor wafers are prone to contamination by oxygen or dust during process movement in semiconductor production, leading to low yield and efficiency issues.

Innovation Solution

A method for supplying inert gas, specifically nitrogen gas, to the Side Track Buffer (STB) system, which includes sensing FOUP loading, measuring gas pressure and flow, and controlling inert gas supply to prevent contamination, along with software management for adding or removing STBs without stopping the system.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If wafers are transported through STB during process movement, then space usability is improved and movement distance is shortened, but wafers are exposed to oxygen or dust causing contamination

Engineering Contradiction:
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The patent introduces an inert gas supply system that fills the STB chamber with inert gas (nitrogen or argon) to create a protected atmosphere during wafer transport. The inert gas supply unit connects to the STB and delivers inert gas when the STB is positioned at loading/unloading ports, preventing wafer exposure to oxygen and dust while maintaining the space-efficient ceiling-mounted STB configuration.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

2Object-affected harmful factors

If inert gas is supplied to prevent contamination, then wafer protection is improved, but system complexity increases

Engineering Contradiction:
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The system automatically detects when the STB is positioned at a loading or unloading port using sensors that detect the presence of the STB. When the sensor detects the STB position, the control unit automatically activates the inert gas supply valve without requiring manual intervention. This self-service automation minimizes system complexity by eliminating the need for complex manual control interfaces while maintaining effective contamination protection.

Inventive Principle:
Principle #25Self-service

3Adaptability or versatility

If STB is added or removed from the system, then system adaptability is improved, but system operation must be stopped

Engineering Contradiction:
Core Design Contradiction:
Adaptability or versatilityVSProductivity

Solution Approach 1:

The STB system is designed as a modular, segmented structure where individual STB units can be independently added or removed from the ceiling-mounted rail system. Each STB operates as an independent module with its own inert gas supply connection, allowing flexible system configuration changes without affecting the operation of other STB units or requiring system shutdown.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Prevents contamination of semiconductor wafers during process movement, improving yield and allowing for increased productivity by maintaining system operation during STB additions or removals.

Implementation Method 1

supplying inert gas to an STB in a semiconductor wafer production system in which a wafer can be prevented from being contaminated from a source of contamination such as oxygen or dust

Methodology Applied
Scientific EffectInert gas atmosphere:

Data Source

PatentUS9496162B2Method for supplying inert gas to STB in semiconductor wafer production system and semiconductor wafer production system using the same
Publication Date: 2016.11.15
  • US9496162B2 patent drawing
  • US9496162B2 patent drawing
  • US9496162B2 patent drawing

AI summary

A method for supplying inert gas to a side track buffer (STB) in a semiconductor wafer production system includes a step of sensing that a front opening unified POD (FOUP) is loading on the STB and generating a first input signal, and a step of opening a valve for inert gas and supplying nitrogen gas to the FOUP based on the first input signal, and to a semiconductor wafer production system using the method.