Stepped Probe Geometry for Secure Terminal Voltage Testing
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Solution Overview
Problem
Probes used for electrical testing often fail to fit optimally into non-standard sized terminals, leading to issues like falling out, expanding the terminal, or damaging the connector housing, which affects the electrical connection and measurement accuracy.
Innovation Solution
A probe design with varying cross-sectional areas, including a tip, base, and intermediate portions, ensuring secure engagement and increased surface area contact without over-expanding the terminal, coupled with a circuit for sensing voltage levels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a probe with uniform cross-sectional area is used, then the probe structure is simple, but the probe cannot securely engage with non-standard terminals and may fall out or damage the connector housing
Solution Approach 1:
The probe employs varying cross-sectional areas at different locations along its length. The tip portion has a smaller cross-sectional area for inserting into terminal cavities, the intermediate portion has a larger cross-sectional area for providing engagement force, and the base portion has a different cross-sectional area for connection to the testing body. This local variation in geometry allows the probe to securely engage with non-standard terminals without requiring a completely complex redesign.
2Reliability
If a probe with larger cross-sectional area is used to increase contact surface area, then electrical connection is improved, but the terminal may be over-expanded or damaged
Solution Approach 1:
The probe's cross-sectional area varies along its length, with the tip portion having a smaller cross-sectional area specifically designed to fit within terminal cavities without over-expanding them. The intermediate portion has a larger cross-sectional area that provides sufficient engagement force and electrical contact surface area. This localized differentiation allows the probe to achieve good electrical connection while preventing terminal damage.
Solution Approach 2:
The probe is divided into distinct segments (tip portion, intermediate portion, and base portion) with different cross-sectional areas. The tip portion is specifically designed for inserting into terminal cavities with minimal expansion, while the intermediate portion provides the necessary contact surface area for reliable electrical connection. This segmentation allows each portion to perform its specific function optimally.
3Object-affected harmful factors
If a probe with smaller cross-sectional area is used to fit into terminal cavities, then terminal damage is reduced, but the probe may fall out due to insufficient engagement force
Solution Approach 1:
The probe is segmented into a tip portion with smaller cross-sectional area for inserting into terminal cavities without causing damage, and an intermediate portion with larger cross-sectional area that provides sufficient engagement force to prevent the probe from falling out. This segmentation allows the probe to simultaneously achieve both goals of minimizing terminal damage and ensuring secure retention.
Solution Approach 2:
Different portions of the probe have different cross-sectional areas tailored to their specific functions. The tip portion has a smaller cross-sectional area localized for inserting into terminal cavities, while the intermediate portion has a larger cross-sectional area localized for providing engagement force. This local quality differentiation resolves the contradiction between fitting into cavities and preventing probe dropout.
Data Source
AI summary
A device for testing a voltage level in an electrical terminal cavity including a testing body and a probe for contacting the electrical terminal cavity. The probe includes a tip portion having a first cross-sectional area, a base portion having a second cross-sectional area, and an intermediate portion extending from the tip portion to the base portion having a third cross-sectional area. The first cross-sectional area is smaller than the third cross-sectional area, the third cross-sectional area is smaller than the second cross-sectional area, and the intermediate portion is concentric with the tip portion and the base portion. An axis extends between a center of the tip portion, a center of the intermediate portion, a center of the base portion, and a center of the testing body. The device also includes a circuit operatively coupled with the probe to sense the voltage level in the electrical terminal cavity.