Stereo Beam Profile Analysis for Reliable Material Detection
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Solution Overview
Problem
Existing methods for material classification and identification face challenges in reliability and resource/cost efficiency.
Innovation Solution
A detector system comprising a projector and two cameras with optical sensors, configured to project an illumination pattern and capture reflection images from different angles, allowing for the evaluation of beam profiles to determine material properties.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single camera and projector system is used for beam profile analysis, then the device complexity is low, but the material classification reliability is insufficient
Solution Approach 1:
The patent divides the detection system into two separate camera systems (first and second cameras) that capture beam profiles from different directions. This segmentation allows for multi-angle analysis of material properties, improving classification reliability by comparing and correlating data from multiple viewpoints rather than relying on a single camera system.
Solution Approach 2:
The patent introduces a spatial dimension by capturing beam profiles from multiple directions (first direction and second direction). This multi-dimensional approach enables more comprehensive material characterization by analyzing how light interacts with materials from different angles, thereby improving reliability without requiring overly complex equipment.
2Measurement precision
If multiple cameras and projectors are used to improve material detection accuracy, then the measurement precision is improved, but the technical effort and resource requirements increase
Solution Approach 1:
The patent employs a universal evaluation device that processes beam profile data from multiple cameras using a standardized evaluation methodology. This multi-functional evaluation system handles data from different camera angles and directions through a unified processing framework, improving measurement precision while avoiding the need for separate complex processing systems for each camera.
Solution Approach 2:
The patent combines data from multiple camera systems into a unified evaluation process. By merging the beam profile information from the first and second cameras through a single evaluation device, the system achieves improved measurement precision while minimizing the technical effort required, as the evaluation methodology remains consistent rather than requiring separate complex processing chains.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable material property identification with low technical effort and resource requirements, enhancing accuracy and efficiency in material classification.
Implementation Method 1
each first optical sensor generates at least one sensor signal in response to illumination of a light-sensitive area by a reflection light beam
Data Source
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AI summary
A detector (110) for determining at least one material property of at least one object (112) is proposed. The detector (110) comprises - at least one projector (116) configured for illuminating the object (112) with at least one illumination pattern (118) comprising a plurality of illumination features (120); - at least one first camera (122) having at least one first sensor element, wherein the first sensor element has a matrix of first optical sensors, the first optical sensors each having a light-sensitive area, wherein each first optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the first camera (122), wherein the first camera (122) is configured for imaging at least one first reflection image comprising a plurality of first reflection features generated by the object (112) in response to illumination by the illumination features (120), wherein the first camera (122) is arranged such that the first reflection image is imaged under a first direction of view to the object (112); - at least one second camera (124) having at least one second sensor element, wherein the second sensor element has a matrix of second optical sensors, the second optical sensors each having a light-sensitive area, wherein each second optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the second camera (124), wherein the second camera (124) is configured for imaging at least one second reflection image comprising a plurality of second reflection features generated by the object (112) in response to illumination by the illumination feature (120), wherein the second camera (124) is arranged such that the second reflection image is imaged under a second direction of view to the object (112), wherein the first direction of view and the second direction of view differ; - at least one evaluation device (126) configured for evaluating the first reflection image and the second reflection image, wherein the evaluation comprises matching the first reflection features and the second reflection features and determining a combined material property of matched pairs of first and second reflection features by analysis of their beam profiles.