Stereo Beam Profile Analysis for Precise Material Identification
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Solution Overview
Problem
Existing material classification and identification methods face challenges in reliability and resource/cost efficiency.
Innovation Solution
A detector system comprising a projector and two cameras with optical sensors, configured to illuminate an object with a pattern and capture reflection images from different angles, analyzing beam profiles to determine material properties.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If beam profile analysis is used for material classification, then material identification capability is improved, but measurement precision and reliability remain insufficient
Solution Approach 1:
The patent transitions from single-camera 2D image capture to multi-camera 3D stereo vision, adding the depth dimension to material analysis. By capturing beam profiles at multiple depths and angles simultaneously, the system extracts additional material properties such as scattering coefficients and penetration depth, significantly improving measurement precision while maintaining versatility.
Solution Approach 2:
The patent divides the material analysis process into separate evaluation steps: depth measurement using beam profile analysis, material property extraction using multiple cameras, and feature matching. This segmentation allows each component to be optimized independently, improving overall measurement precision without compromising the versatility of material identification.
2Reliability
If reliable material classification is achieved, then identification accuracy is improved, but device complexity and resource requirements increase
Solution Approach 1:
The patent employs a multi-camera system where each camera serves multiple functions: capturing beam profiles for depth measurement, extracting material properties, and providing redundant data for reliability verification. This multi-functionality allows the system to achieve high reliability through existing hardware rather than adding specialized components, thereby limiting the increase in device complexity.
Solution Approach 2:
The patent implements feedback mechanisms where the evaluation device cross-validates material property determinations across multiple cameras and depth levels. By comparing results from different viewing angles and depths, the system can verify identification accuracy and request re-measurement only when necessary, maintaining high reliability without requiring overly complex error correction systems.
3Measurement precision
If multiple cameras are used for stereo beam profile analysis, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent adds the depth dimension to traditional 2D imaging by using multiple cameras at different positions and angles. This enables precise measurement of beam profile characteristics in three-dimensional space, improving measurement precision for material properties such as scattering and penetration depth while using standard camera hardware rather than specialized sensors.
Solution Approach 2:
The patent uses multiple cameras as redundant copies of the same sensing function, each capturing the beam profile from a different perspective. This redundancy improves measurement precision through data fusion and cross-validation while keeping each individual camera component simple and cost-effective, avoiding the need for complex specialized sensors.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable material identification with low technical effort and resource requirements, using a detector that can be integrated into mobile devices for various applications.
Implementation Method 1
recording at least one reflection image of a light beam originating from at least one object
Data Source
AI summary
Disclosed herein is a detector for determining at least one material property of at least one object. The detector includesat least one projector configured for illuminating the object with at least one illumination pattern including a plurality of illumination features;at least one first camera having at least one first sensor element;at least one second camera having at least one second sensor element; andat least one evaluation device configured for evaluating a first reflection image and the second reflection image.