Storage Control Device Grouping Defective Sectors
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Solution Overview
Problem
Conventional storage control devices face increased memory consumption for managing error regions, leading to potential memory overflow as storage capacity grows, especially when managing defective sectors, which can result in incomplete deletion of defective sectors during overwriting.
Innovation Solution
The storage control device identifies defective sectors by grouping logical block addresses and using bit information to determine which groups contain errors, reducing memory usage by reading and managing data within identified error groups, thereby minimizing the data size required for defective sector management.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the storage control device stores detailed position information of each defective sector in memory, then the accuracy of defective sector management is improved, but the memory consumption increases and may cause memory overflow as storage capacity grows
Solution Approach 1:
The patent divides the storage space into multiple groups and uses bit information to indicate whether each group contains defective sectors. This segmentation approach reduces memory consumption by storing only group-level defect information rather than detailed sector-level information, while still enabling effective defective sector management through group identification and selective reading.
2Quantity of substance
If the device reads and manages data within identified error groups using bit information, then memory usage is reduced, but the complexity of identifying and managing defective sectors increases
Solution Approach 1:
The patent pre-divides the storage space into groups and prepares bit information for each group before actual defective sector management is needed. This preliminary organization of data into groups with associated bit flags simplifies the subsequent identification process, as the system only needs to check bit information to quickly locate potential defective sectors without scanning entire storage regions.
Data Source
AI summary
A storage control device configured to control a storage device including a plurality of groups each of which includes a plurality of storage regions, the storage control device includes a memory and a processor coupled to the memory and configured to store, into the memory, information associated with each of the plurality of groups and indicating whether an error region in which an error is detected is included in at least one of the plurality of storage regions of each of the plurality of groups, identify a first group including the error region from the plurality of groups based on the information associated with the plurality of groups, read data from a plurality of storage regions included in the identified first group, and identify the error region included in the first group based on the read data.