Storage Controller Bad Block Replacement via Interleaving-Aware Die Selection
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Solution Overview
Problem
Existing storage devices face challenges in maintaining interleaving performance while managing bad blocks, as they need to replace faulty memory blocks with preliminary blocks efficiently across multiple dies and planes, which can disrupt parallel operations.
Innovation Solution
A controller is designed to manage bad blocks by generating replacement die recommendation information and determining whether full plane interleaving operations are possible, allowing it to select and replace bad blocks with preliminary blocks from other dies, thus maintaining interleaving performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If bad blocks are replaced with preliminary blocks from the same die, then reliability is improved, but interleaving performance deteriorates due to disruption of parallel operations across dies and planes
Solution Approach 1:
The patent introduces a replacement die as an intermediary when a bad block is detected. Instead of directly replacing within the same die (which would disrupt interleaving), the controller selects a replacement die from the plurality of dies to serve as a mediator for the bad block replacement, thereby maintaining the parallel operation structure across dies while achieving reliable bad block management
Solution Approach 2:
The patent extends the replacement strategy from the die level to the plane level within replacement dies. By selecting preliminary blocks from different planes of the replacement die based on whether full plane interleaving is possible, the system adds a dimensional aspect to the replacement process, allowing maintenance of interleaving performance through cross-plane operations while replacing bad blocks
2Device complexity
If replacement blocks are selected without considering full plane interleaving, then device complexity is reduced, but interleaving performance deteriorates
Solution Approach 1:
The patent implements a dynamic replacement block selection mechanism that adapts to the interleaving capability of the replacement die. The controller determines whether full plane interleving is possible for the selected replacement die and adjusts the preliminary block selection accordingly - selecting from multiple planes when interleaving is possible, and from the same plane when it is not. This dynamic adaptation maintains interleaving performance without requiring overly complex predetermined selection rules
Data Source
AI summary
The present technology relates to a semiconductor device. According to the present technology, a storage device capable of managing a bad block while maintaining interleaving performance may include a data storage device including a plurality of dies connected to a channel, and each of the dies includes a plurality of planes capable of a plane interleaving operation. Each of the planes includes a data storage device including a plurality of memory blocks, and a controller configured to control, when a bad block occurs in a target die among the plurality of dies, the data storage device to determine a replacement die corresponding to the target die among the dies based on replacement die recommendation information and control the data storage device to replace the bad block with a preliminary block included in the replacement die based on information on whether the plane interleaving operation is possible.