Storage Controller Die Failure Simulation
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Solution Overview
Problem
Current methods for validating die failures in semiconductor memory devices, such as flash memory, either manipulate hardware to induce failures or examine already failed hardware, which do not accurately represent actual failure modes and may exhibit different failure behaviors at the time of observation compared to the original failure.
Innovation Solution
A system and method to simulate memory operation failures on memory portions, allowing for the testing of error recovery mechanisms by modifying configuration settings and executing error recovery mechanisms in response to simulated failures, enabling realistic evaluation of error recovery processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If hardware is manipulated to induce failures for validation, then failure testing can be performed, but the failure modes do not accurately represent actual die failures
Solution Approach 1:
The patent creates a virtual copy of the memory device that replicates actual die failure modes through software simulation rather than hardware manipulation. This virtual model accurately reproduces failure behaviors observed in real failed devices, allowing validation testing without physically altering hardware.
Solution Approach 2:
The patent introduces a failure simulation layer as an intermediary between the test system and the memory device. This layer translates actual failure modes into simulated failure conditions, mediating between real hardware and test validation without requiring direct hardware manipulation.
2Measurement precision
If already failed hardware is examined to determine failure occurrence, then actual failure modes can be observed, but the failure behavior may differ from the original failure condition
Solution Approach 1:
The patent performs preliminary capture of failure modes from actual failed devices, storing this information for later use. By capturing failure characteristics before examination, the system can reproduce the exact failure conditions without the device being in a changed state.
Solution Approach 2:
The patent creates accurate copies of failure modes from real failed devices and uses these copies for simulation. This allows repeated testing of the same failure condition without examining the original failed hardware again, preventing changes in failure behavior.
3Adaptability or versatility
If configuration settings are modified to simulate failures, then error recovery mechanisms can be tested, but additional testing infrastructure is required
Solution Approach 1:
The patent creates a universal failure simulation framework that can test multiple types of error recovery mechanisms across different memory devices and failure modes. This single system handles various testing scenarios that would otherwise require separate dedicated testing infrastructures.
Solution Approach 2:
The failure simulation system automatically manages the complexity of testing by self-configuring based on the selected failure mode and target recovery mechanism. The system handles setup, execution, and analysis without requiring complex external testing infrastructure.
Data Source
AI summary
The disclosed method includes, at a storage controller of a storage system, receiving host instructions to modify configuration settings corresponding to a first memory portion of a plurality of memory portions. The method includes, in response to receiving the host instructions to modify the configuration settings, identifying the first memory portion from the host instructions and modifying the configuration settings corresponding to the first memory portion, in accordance with the host instructions. The method includes, after modifying the configuration settings corresponding to the first memory portion, sending one or more commands to perform memory operations having one or more physical addresses corresponding to the first memory portion and receiving a failure notification indicating failed performance of at least a first memory operation of the one or more memory operations. The method includes, in response to receiving the failure notification, executing one or more error recovery mechanisms.