Storage Controller Protecting Pattern for Thermal Process
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Solution Overview
Problem
The increasing integration of non-volatile memory devices in storage devices leads to defects in memory cells due to thermal processes during assembly, which deteriorate the threshold voltage distributions and affect data storage reliability.
Innovation Solution
A storage device and operating method that involve a storage controller receiving a protecting command to generate a protecting pattern by programming a protecting voltage in a converged region where threshold voltage distributions of memory cells converge, thereby minimizing deterioration during thermal processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If thermal process is performed on storage device during assembly, then manufacturing process can be completed, but memory cells deteriorate due to heat
Solution Approach 1:
The patent applies preliminary action by programming a protecting pattern in the converged region before the thermal process is performed. The storage controller receives a protecting command and generates a protecting pattern that prevents memory cell deterioration during subsequent thermal assembly processes, thereby enabling manufacturing while protecting reliability
Solution Approach 2:
The patent implements preliminary anti-action by programming a protecting pattern with specific voltage characteristics before thermal exposure. This protecting pattern counteracts the harmful thermal effects by creating a protective state in the memory cells that prevents threshold voltage distribution convergence during the thermal process
2Reliability
If protecting pattern is programmed before thermal process, then memory cell deterioration is reduced, but additional programming operation is required
Solution Approach 1:
The patent applies universality by designing the protecting pattern programming operation to serve multiple functions: it protects memory cells during thermal processes, maintains threshold voltage distributions, and can be implemented as part of the normal programming operations. This multi-functionality reduces the net increase in device complexity
Data Source
AI summary
A storage device includes a storage controller that receives a protecting command before a thermal process is performed in the storage device, and that generates a protecting pattern by programming a protecting voltage in a converged region where threshold voltage distributions of memory cells in the storage device converge after the thermal process is performed on the storage device.