Storage Debug Port Self-Test for Safe Driving Data Retrieval
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Solution Overview
Problem
Data stored in event data recorders of automated driving vehicles can be damaged or altered due to improper reading techniques following an accident, making it difficult to determine the responsible party for an accident.
Innovation Solution
A storage system with a diagnosis circuit that generates test patterns, a debugging port for auxiliary power, and a self-test circuit to ensure the storage device operates normally, allowing safe retrieval of driving data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of information
If driving data is read using conventional reading techniques after an accident, then data retrieval is possible, but data may be damaged or altered
Solution Approach 1:
The system performs a self-test operation before data retrieval to preliminarily check the storage device's operational status. The diagnosis circuit generates test patterns and verifies storage device responses in advance, ensuring the device is ready for safe data reading operations.
Solution Approach 2:
The storage device performs self-diagnosis through a built-in self-test circuit that automatically tests its own operational status. The diagnosis circuit within the storage device generates test patterns and validates its own functionality without requiring external intervention during the critical assessment phase.
2Reliability
If a self-test circuit is added to verify storage device operation, then data damage is prevented, but system complexity increases
Solution Approach 1:
The diagnosis circuit is integrated within the storage device itself, merging the testing functionality with the storage device structure. This consolidation allows the storage device to perform self-diagnosis without requiring completely separate external testing equipment, thereby managing complexity while maintaining reliability.
Solution Approach 2:
The storage device includes a built-in self-test circuit that enables it to test its own operational status independently. This self-service capability allows the device to verify its own functionality through test patterns, reducing the need for complex external diagnostic systems.
3Ease of operation
If auxiliary power is supplied through a debugging port for self-test, then data retrieval is enabled, but power supply complexity increases
Solution Approach 1:
The debugging port is designed to serve multiple functions: it can supply auxiliary power to the storage device for self-test operations and also serve as a data retrieval interface. This multi-functionality reduces the need for separate dedicated power and data ports, managing power supply complexity while enabling data retrieval.
Data Source
AI summary
A storage system including: a storage device; a diagnosis circuit that generates a test pattern, transmits the test pattern to the storage device, receives result data corresponding to the test pattern from the storage device, and tests whether the storage device normally operates by comparing the test pattern with the result data; and a debugging port that is connected to the diagnosis circuit, receives auxiliary power from an external device, supplies the auxiliary power to the diagnosis circuit, and transmits data in the storage device to the external device.