Storage Device Controller Host Mode Testing
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Solution Overview
Problem
There is a need for a method to test the performance of storage devices developed according to new standards, as existing technologies lack a standardized approach for evaluating these devices.
Innovation Solution
A test system comprising a first storage device operating in host mode and a second storage device operating in device mode, where the first device creates and transmits command units to the second device, and processes response units received from it, facilitating the testing of the second device's performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a storage device is developed according to an updated standard, then the storage device can achieve new performance and functionality, but there is no standardized method to test the performance of the newly developed device
Solution Approach 1:
The patent introduces a test device as an intermediary component that facilitates performance testing of storage devices. The test device includes a processor that can operate in host mode to generate commands and in device mode to process responses, serving as a mediator between the storage device under test and the testing system. This intermediary enables standardized performance evaluation without requiring complex external testing equipment.
Solution Approach 2:
The test device is designed with multi-functionality to serve multiple purposes in the testing process. The same processor can operate in both host mode and device mode, and the buffer memory can function as both command storage and response processing area. This universal design simplifies the testing system and enables comprehensive performance evaluation of storage devices according to updated standards.
2Reliability
If a test system is designed with separate host and device components, then the testing process becomes more controlled and standardized, but the system complexity increases
Solution Approach 1:
The patent merges the host and device functionalities into a single test device with a unified processor. The processor can switch between host mode and device mode depending on the testing requirement, combining what would traditionally be separate components into one integrated unit. This merging reduces system complexity while maintaining the controlled testing process through mode switching mechanisms.
Solution Approach 2:
The test device employs dynamic mode switching capability where the processor can transition between host mode and device mode based on the testing phase. In host mode, the processor generates and transmits commands; in device mode, it processes responses. This dynamic adaptability allows the same hardware to serve multiple functions, reducing overall system complexity while maintaining reliable testing control.
3Productivity
If command units and response units are processed in buffer memory, then the testing speed and data processing efficiency are improved, but the memory requirements and data handling complexity increase
Solution Approach 1:
The buffer memory is designed to serve itself by automatically storing command units received from the host and preparing response units for transmission. The processor utilizes the buffer memory's storage capacity to hold test data and commands locally, eliminating the need for continuous external memory access. This self-service approach improves data processing speed while keeping the data handling mechanism relatively simple through direct buffer operations.
Solution Approach 2:
The buffer memory performs preliminary actions by pre-storing command units before they are transmitted to the storage device under test. The processor prepares and buffers commands in advance, allowing for more efficient data processing and reducing real-time computation requirements. This preliminary action approach enhances productivity while maintaining simple data handling through straightforward buffer fill and read operations.
Data Source
AI summary
A storage device operates in host mode or device mode, and the storage device operating in host mode may transmit and receive various information units with the storage device operating in device mode to perform tests on the storage device operating in device mode, thereby performing the test of a storage device in development.