Semiconductor Storage Device Throttling via Idle Time Insertion

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Solution Overview

Problem

Semiconductor storage devices with non-volatile memory have a limited lifespan due to endurance limits from program and erase cycles, making it challenging to ensure their longevity, especially under high workloads in server applications and other devices.

Innovation Solution

A method and system for throttling the performance of semiconductor storage devices by inserting idle time based on estimated future workloads, using a controller to gather workload data, estimate future demands, and adjust performance levels to extend device lifespan.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If high workload operations (write, erase, read) are performed to meet performance demands, then productivity is improved, but the lifespan of the semiconductor storage device deteriorates due to exceeding endurance limits of PE cycles

Engineering Contradiction:
ImproveI/O performanceVSAvoiddevice lifespan
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The controller performs preliminary actions by gathering workload data and estimating future workload demands before executing operations. This allows the system to proactively adjust performance levels and insert idle time in advance, preventing excessive PE cycles before they occur, thereby protecting device lifespan while maintaining necessary productivity

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system dynamically adjusts performance levels based on real-time workload analysis and future demand estimation. The controller modifies operation timing and inserts idle time adaptively, transforming the static performance characteristic into a dynamic one that balances productivity requirements with reliability constraints by varying the pace of PE cycles

Inventive Principle:
Principle #15Dynamics

2Reliability

If performance throttling is applied to extend device lifespan, then reliability is improved, but productivity decreases due to reduced I/O operations per second

Engineering Contradiction:
Improvedevice lifespanVSAvoidI/O performance
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The controller applies partial throttling by selectively inserting idle time only when future workload estimation indicates risk of exceeding endurance limits. Rather than consistently reducing performance, the system applies performance management only when necessary, maintaining full productivity during safe operation periods while extending lifespan during high-risk periods

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The system implements feedback control by continuously gathering workload data, estimating future demands, and adjusting performance levels accordingly. This closed-loop approach ensures that productivity is maintained at maximum levels when device stress is low, while automatically applying throttling when reliability risks are detected, optimizing the balance between the two competing objectives

Inventive Principle:
Principle #23Feedback

3Reliability

If idle time is inserted to reduce workload intensity and extend lifespan, then reliability is improved, but time loss increases due to reduced operational efficiency

Engineering Contradiction:
Improvedevice lifespanVSAvoidoperational efficiency
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The controller inserts idle time as a preliminary protective measure before the device reaches critical wear thresholds. By proactively managing operation pacing based on future workload estimation, the system prevents excessive PE cycles from occurring in the first place, extending lifespan without requiring continuous idle time insertion that would significantly impact operational efficiency

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system changes the timing parameters of operations dynamically, adjusting the interval between write, erase, and read operations based on workload intensity and future demand predictions. This parameter adjustment allows the device to operate efficiently during low-stress periods while inserting appropriate idle time during high-stress periods, minimizing overall time loss while achieving lifespan extension

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9348521B2Semiconductor storage device and method of throttling performance of the same
Publication Date: 2016.05.24 SAMSUNG ELECTRONICS CO LTD
  • US9348521B2 patent drawing
  • US9348521B2 patent drawing
  • US9348521B2 patent drawing

AI summary

A semiconductor storage device and a method of throttling performance of the same are provided. The semiconductor storage device includes a non-volatile memory device; and a controller configured to receive a write command from a host and program write data received from the host to the non-volatile memory device in response to the write command. The controller inserts idle time after receiving the write data from the host and/or after programming the write data to the non-volatile memory device.