Storage Device Selection via Reliability and Load Metrics
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Solution Overview
Problem
Conventional data read algorithms in storage systems with mapped RAID architecture do not consider the reliability and access load of storage devices, leading to inefficient data read operations and reduced performance due to potential reads from devices with low reliability or high access loads.
Innovation Solution
A method to determine the target storage device for reading data based on the reliability and access load of multiple storage devices, ensuring that data is read from a device with higher reliability and lower access load, thereby balancing load and extending service life.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If data is read using conventional round robin method from multiple storage devices, then data access simplicity is maintained, but data read efficiency and system performance deteriorate due to potential reads from devices with low reliability or high access load
Solution Approach 1:
The patent changes the selection parameter from simple round-robin indexing to a composite parameter considering reliability metrics and access load metrics. The storage device selection is based on comparing reliability values and access load values across multiple devices, selecting the device with highest reliability and lowest access load, thereby improving data read efficiency without excessive complexity
Solution Approach 2:
The system implements feedback mechanisms by continuously monitoring reliability metrics and access load metrics of storage devices. These metrics are fed back into the selection process, allowing the system to dynamically adjust which storage device is chosen for data retrieval, optimizing performance based on current system state
2Reliability
If data is read from storage devices without considering reliability and access load, then system operation simplicity is maintained, but system performance and service life deteriorate
Solution Approach 1:
The patent introduces reliability parameters and access load parameters as explicit selection criteria. Instead of simple sequential access, the system evaluates multiple parameters (reliability metric, access load metric) to determine the optimal storage device, thereby improving data read reliability while maintaining reasonable operational simplicity through automated selection
3Duration of action of stationary object
If conventional round robin method is used for data reading, then load distribution appears uniform, but actual service life and performance deteriorate due to ignoring device reliability and current load conditions
Solution Approach 1:
The patent changes the load distribution mechanism from uniform round-robin allocation to intelligent allocation based on reliability parameters and access load parameters. The system selects storage devices with higher reliability and lower current load, which extends device service life by avoiding overuse of vulnerable devices while maintaining high data access performance through optimal device selection
Data Source
AI summary
Techniques are directed to reading data. Such techniques involve in response to receiving a read request for the target data, determining that target data is stored in both a first storage device and a second storage device. Such techniques further involve determining at least one of reliability and access load for each of the first storage device and the second storage device. Such techniques further involve: determining, based on the at least one of the reliability and the access load, one of the first storage device and the second storage device as a target storage device so as to respond to the read request. By means of certain techniques, at least one of the access load and service lives is balanced between storage devices so as to improve the efficiency of data read and the overall performance of a storage system.


