Automated Storage Device Test System for Defect Detection
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Solution Overview
Problem
As the degree of flawlessness in storage device development increases, it becomes increasingly difficult to detect and diagnose defects that may occur during actual use, as the likelihood of recreating these defects decreases.
Innovation Solution
A storage device test system that includes a mounting unit, a test control unit, an interface plug, and a plugging driving unit to accurately determine defects by controlling the plug-in and unplug operations of the interface plug, allowing for independent operation of test and plugging control units, and includes a database for logging defect data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If the degree of flawlessness in product development increases, then product quality improves, but the ability to detect and diagnose defects decreases
Solution Approach 1:
The test system performs plug-in and unplug operations under controlled conditions before actual product deployment. By proactively creating potential defect scenarios through automated plugging/unplugging cycles, the system can detect defects early in the development phase rather than waiting for field failures, thus maintaining high product quality while preserving defect detection capability
Solution Approach 2:
The interface plug serves as an intermediary component between the test control unit and the storage device. This mediator enables controlled electrical connection and disconnection, allowing the system to simulate real-world plugging/unplugging scenarios that may cause defects, thereby maintaining both high product quality and effective defect detection
2Measurement precision
If automated plugging and unplug operations are performed, then defect detection accuracy improves, but system complexity increases
Solution Approach 1:
The test control unit is designed to perform multiple functions: controlling the plugging driving unit for automated connection/disconnection, managing the interface plug operations, executing test sequences, and analyzing defect data. By consolidating these functions into a single multi-functional unit, the system achieves high defect detection accuracy without proportionally increasing overall system complexity
Solution Approach 2:
The plugging driving unit automatically controls the interface plug's connection and disconnection without manual intervention. The system self-manages the automated plugging/unplugging sequence, positioning operations, and timing control, thereby reducing operational complexity while maintaining high defect detection accuracy through consistent automated execution
3Reliability
If plug-in and unplug operations are controlled precisely, then defect recreation capability improves, but operation time increases
Solution Approach 1:
The test system employs periodic plug-in and unplug operations at controlled intervals. By repeating these connection and disconnection cycles automatically, the system can recreate defect conditions reliably over multiple iterations without requiring excessive total test time, thus balancing defect recreation capability with operational efficiency
Solution Approach 2:
The plugging driving unit rapidly positions and connects the interface plug to the storage device during automated sequences. By accelerating the physical positioning and connection phases while maintaining precise control over critical test parameters, the system reduces overall operation time while preserving reliable defect recreation capability during the essential test windows
Data Source
AI summary
A storage device test system includes: a storage device mounting unit configured to mount a storage device therein; a test control unit configured to transmit and/or receive test signals to and/or from the storage device; an interface plug that is electrically connected to the test control unit and coupled to the storage device mounted in the storage device mounting unit; and a plugging driving unit that controls a relative location between the interface plug and the storage device mounting unit. By using the storage device test system, the causes of defects that may occur while using a storage device may be easily detected.