Storage Device Testing With Integrated Transition Models
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Solution Overview
Problem
As semiconductor manufacturing technology advances, the increasing integration and capacity of storage devices lead to reduced reliability due to changes in structure, necessitating improved testing methods to ensure efficient and accurate operation.
Innovation Solution
A host device generates sub-transition models based on state variables and transition commands, determines a root state value, and creates an integrated transition model to provide valid workloads to storage devices, enhancing test efficiency and accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If random command generation is used for testing storage devices, then test coverage may be achieved, but test efficiency and accuracy deteriorate due to generation of invalid workloads
Solution Approach 1:
The patent applies preliminary action by pre-generating valid workloads based on the storage device's transition model before actual testing begins. The host device creates a comprehensive set of valid commands according to the device's state transitions and communication interface specifications, storing them for subsequent test execution. This eliminates the need for random command generation during testing, ensuring that only valid workloads are applied to the storage device, thereby improving test accuracy and efficiency.
2Reliability
If integrated transition model is used to generate valid workloads, then test accuracy is improved, but device complexity increases due to model generation process
Solution Approach 1:
The patent applies segmentation by dividing the workload generation process into distinct functional modules: a transition model generation unit that creates the state transition model based on communication interface specifications, a workload generation unit that produces valid workloads according to the transition model, and a test execution unit that applies these workloads to the storage device. This modular architecture manages complexity by separating concerns, allowing each unit to perform its specific function independently while contributing to the overall goal of reliable storage device testing.
Data Source
AI summary
A method of operating a host device to test a storage device includes: loading a plurality of state variables and a plurality of transition commands included in a communication interface specification supported by the storage device, generating a plurality of sub-transition models based on the plurality of state variables and the plurality of transition commands, determining a root state value of the plurality of state variables common to a subset of the sub-transition models, generating an integrated transition model based on the subset of the plurality of sub-transition models and the root state value, and providing workloads to the storage device based on the integrated transition model.