Storage Duplication Management Minimizing Simultaneous Failures

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Solution Overview

Problem

Mirroring between identical hard disk drives in storage systems can lead to simultaneous failures due to manufacturing lot issues, resulting in data loss, and using different types of storage devices for mirroring reduces data access speed and efficiency.

Innovation Solution

A duplication combination management program that calculates a simultaneous failure occurrence degree based on manufacture date information to determine optimal combinations of storage apparatus for mirroring, minimizing the likelihood of simultaneous failures by selecting devices with the longest manufacturing interval.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If mirroring is performed between storage apparatus of different types, then simultaneous failures from the same cause can be prevented, but data access speed depends on the lower-performance storage apparatus and efficiency in data access falls

Engineering Contradiction:
Improvesimultaneous failure preventionVSAvoiddata access speed
Core Design Contradiction:
ReliabilityVSSpeed

Solution Approach 1:

The patent applies parameter changes by shifting the selection criterion from storage device type heterogeneity to manufacture date heterogeneity. Instead of mixing different storage types (HDD and SSD) to prevent simultaneous failures, the system pairs storage devices with different manufacture dates, thereby preventing lot failures while maintaining comparable performance characteristics and data access speeds.

Inventive Principle:
Principle #35Parameter changes

2Speed

If the same model of hard disk drives are used for mirroring, then data access performance is equal and performance can be demonstrated sufficiently, but lot failures can cause simultaneous breakdowns of both storage apparatus

Engineering Contradiction:
Improvedata access performanceVSAvoidsimultaneous failure risk
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent changes the critical parameter from storage device model uniformity to manufacture date differentiation. By selecting storage devices with different manufacture dates, the system avoids the lot failure risk associated with using the same model while still maintaining sufficient performance equality for effective mirroring operation.

Inventive Principle:
Principle #35Parameter changes

3Productivity

If mirroring is performed between storage apparatus manufactured at the same time, then performance is optimized, but the probability of simultaneous failures due to manufacturing lot issues increases

Engineering Contradiction:
Improvemirroring efficiencyVSAvoidsimultaneous failure probability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent fundamentally changes the selection parameter from manufacture date proximity to manufacture date differentiation. This reversal of the conventional approach prioritizes reliability by selecting storage devices with the greatest manufacturing date differences, thereby minimizing the risk of simultaneous failures from common manufacturing defects while maintaining adequate mirroring efficiency.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS8032784B2Duplication combination management program, duplication combination management apparatus, and duplication combination management method
Publication Date: 2011.10.04 FUJITSU LTD
  • US8032784B2 patent drawing
  • US8032784B2 patent drawing
  • US8032784B2 patent drawing

AI summary

A simultaneous failure occurrence degree calculation section calculates a simultaneous failure occurrence degree a value of which becomes smaller with an increase in a difference between numeric values indicative of manufacture date information on a computer which performs a process on the basis of a duplication combination management program. A combination pattern generation section then combines two of a plurality of storage apparatus and generates a plurality of combination patterns. A simultaneous failure occurrence degree adding section then calculates a total of simultaneous failure occurrence degrees corresponding to combinations of storage apparatus for each of the plurality of combination patterns. A duplication combination pattern determination section then determines that a combination pattern for which the total of simultaneous failure occurrence degrees is the smallest is a duplication combination pattern.