Storage Slot Load Emulator for Low-Cost SSD Thermal Testing
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Solution Overview
Problem
Current storage array testing methods require expensive enterprise-level SSDs and incur high costs due to wear leveling issues, necessitating frequent replacements during prolonged testing.
Innovation Solution
A storage testing device that simulates thermal and power loads using a resistor load bank, without actual storage elements, to emulate SSDs, coupled with sensors to measure and report thermal and power data, allowing the storage controller to model array response.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If expensive enterprise-level SSDs are used for testing storage arrays, then the testing can simulate real storage device behavior and load, but the testing cost increases significantly
Solution Approach 1:
The patent creates a simplified copy of SSD behavior using a resistor load bank that mimics the electrical and thermal characteristics of real SSDs without containing actual storage elements. This copying approach allows the testing device to simulate SSD load profiles, power consumption patterns, and thermal generation while costing significantly less than actual enterprise SSDs
Solution Approach 2:
The resistor load bank serves as a disposable or reusable testing artifact that can be inserted into storage array slots to perform durability and load testing. Unlike expensive SSDs that may need replacement due to wear leveling during extended testing, the resistor load bank has no wear mechanisms and can be used indefinitely for testing purposes
2Duration of action of moving object
If SSDs are used for prolonged durability testing, then real storage device performance can be evaluated, but wear leveling causes SSDs to become unusable after extended periods requiring frequent replacements
Solution Approach 1:
The patent extracts the essential testing functions from actual SSDs by removing the storage elements (NAND flash memory, controllers, etc.) and retaining only the electrical and thermal characteristics needed for durability testing. The resistor load bank captures power consumption, thermal generation, and electrical load profiles while eliminating the wear-prone storage components
Solution Approach 2:
The resistor load bank acts as a non-consumable testing artifact that does not experience wear leveling or degradation over time. It can remain in the storage array slot indefinitely, allowing extended durability testing without the need for replacement that plagues actual SSDs used in prolonged testing scenarios
3Productivity
If actual SSDs are used for testing, then comprehensive storage device functionality can be tested, but the need to replace worn SSDs increases operational complexity and time
Solution Approach 1:
The resistor load bank copies the essential electrical and thermal behavior of SSDs needed for durability and load testing. By simulating these characteristics without actual storage elements, the device enables continuous testing operations without interruptions for replacement, thereby improving testing throughput and eliminating time loss associated with device swaps
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Reduces testing costs significantly by using less expensive devices that mimic SSD behavior, effectively testing storage arrays and controllers without the need for actual SSDs, while avoiding wear leveling issues.
Implementation Method 1
A storage testing device fits into a slot of a storage system including a controller. The storage testing device includes a resistor load bank to generate a thermal load during operation when the storage testing device is positioned in the slot.
Implementation Method 2
At least one sensor generates a measurement of the thermal load to provide to the controller.
Data Source
AI summary
Provided are a storage testing device, system, and method for testing a storage system. A storage testing device fits into a slot of a storage system including a controller. The storage testing device includes a resistor load bank to generate a thermal load during operation when the storage testing device is positioned in the slot. The generated thermal load is transferred to the slot. At least one sensor generates a measurement of the thermal load to provide to the controller.