Storage System Data Validation via Test Data Injection
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Solution Overview
Problem
Conventional data validation techniques in storage systems can only identify data write failures but cannot analyze the cause, leading to inefficient failure diagnosis and performance degradation due to lack of internal state and history data.
Innovation Solution
The method writes host data and test data to a storage device, including host-specific and storage-specific information, allowing for efficient validation and failure analysis by comparing the test data to determine if the host data was written correctly and identifying the cause of failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional data validation techniques are used, then data write failures can be identified, but the cause of failures cannot be analyzed
Solution Approach 1:
The patent applies preliminary action by writing test data to the storage device before actual host data is written. This test data includes expected values and metadata that will enable future validation and failure analysis. By preparing this reference information in advance, the system can later compare actual written data against the pre-stored test data to diagnose failures accurately without losing critical information.
Solution Approach 2:
The patent uses test data as an intermediary between the host data and the validation process. This test data acts as a mediator that carries both the expected outcome and metadata about the write operation. When validation is needed, this intermediary test data is compared against the actual written data, enabling precise failure diagnosis while preserving all necessary information about what was written and what was expected.
2Productivity
If data validation is performed without test data, then storage system operation is simple, but failure diagnosis is inefficient
Solution Approach 1:
The patent merges the validation function with the existing data writing process by incorporating test data generation and storage into the normal write path. Instead of adding a separate validation system, the test data is combined with the host data write operation, and validation is performed by comparing against this integrated test data. This merging approach improves failure diagnosis efficiency while minimizing additional complexity.
Solution Approach 2:
The storage system performs self-validation by using its own written test data as the reference for comparison. The system writes test data with expected values, then uses these same test data to validate subsequent reads or writes. This self-service approach enables efficient failure diagnosis without requiring external validation tools or complex external testing infrastructure.
3Measurement precision
If test data is written along with host data, then validation accuracy is improved, but storage device workload increases
Solution Approach 1:
The patent applies partial action by writing test data only for specific validation scenarios rather than continuously for all operations. The test data is written alongside host data when validation is needed, but not necessarily for every single write operation. This partial approach maintains high validation accuracy when required while avoiding the excessive energy consumption that would result from always writing comprehensive test data.
Data Source
AI summary
A method is used in validating data in a storage system. The method writes host data to the storage system during processing of a host I/O operation, where the host is in communication with the storage system. The storage system writes host data and test data associated with the host data to a storage device of the storage system. The method reads the host data and the test data from the storage device for validating the host data, and evaluates the test data to determine whether the host data has been written correctly by the storage system to the storage device. Upon determining that the host data has not been written correctly by the storage system to the storage device due to a failure, the method evaluates the test data to determine a cause of the failure.