Strain Gauge Resin Substrate Creep Reduction
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Solution Overview
Problem
Strain gauges formed with resin substrates often experience creep, which poses a significant challenge in maintaining accuracy and reliability.
Innovation Solution
The strain gauge incorporates a resin substrate with a resistor formed from a film containing Cr, CrN, and Cr2N on one side, and an inorganic insulating layer on the other side, positioned to overlap the resistor region, thereby reducing creep.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a resin substrate is used for the strain gauge, then ease of manufacture and flexibility are improved, but creep occurs leading to reduced measurement precision and reliability
Solution Approach 1:
The patent applies composite materials by combining the resin substrate with an inorganic insulating layer having low creep characteristics. This composite structure allows the strain gauge to maintain the manufacturing advantages of resin substrates while compensating for their creep-related precision issues through the stabilizing effect of the inorganic layer.
Solution Approach 2:
The patent changes the physical and chemical parameters of the substrate system by selecting specific inorganic insulating materials with particular creep resistance properties. By adjusting the material composition and thermal expansion coefficients of the inorganic layer, the overall creep behavior of the strain gauge is optimized while maintaining resin substrate benefits.
2Ease of manufacture
If a resin substrate is used for the strain gauge, then flexibility and ease of manufacture are improved, but reliability deteriorates due to creep
Solution Approach 1:
The patent applies composite materials by combining the resin substrate with an inorganic insulating layer having low creep characteristics. This composite structure allows the strain gauge to maintain the manufacturing advantages of resin substrates while compensating for their creep-related precision issues through the stabilizing effect of the inorganic layer.
3Measurement precision
If the inorganic insulating layer is formed to overlap the resistor region, then measurement precision is improved by reducing creep, but device complexity increases
Solution Approach 1:
The patent applies local quality by forming the inorganic insulating layer specifically at positions overlapping the resistor region rather than uniformly across the entire substrate. This localized approach provides creep compensation precisely where it is needed for measurement accuracy while minimizing the additional complexity and material usage compared to a full-coverage layer.
Data Source
AI summary
A strain gauge according to the present disclosure includes: a resin substrate; a resistor formed of a film containing Cr, CrN, and Cr2N on one side of the substrate; and an inorganic insulating layer formed on another side of the substrate, and, in this strain gauge, the inorganic insulating layer is formed at least at a position overlapping a region where the resistor is formed in plan view.


