Strain Sensor Nanohole Marker for Nanometer Displacement

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Solution Overview

Problem

Existing strain sensors face difficulties in accurately measuring nanometer-scale displacements due to limitations in detecting small variations in emission wavelength or camera resolution, making it challenging to measure strains with nanometer-scale displacements effectively.

Innovation Solution

A strain sensor system comprising a light source, a marker with a nanohole array structure, and a detector that calculates strain amounts based on light intensity variations, where the marker's first and second media with different refractive indexes deform in response to loads, allowing for precise measurement of strain fields with nanometer-scale displacements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If mechanoluminescent elements are used to measure strain fields, then strain measurement capability is improved, but measurement precision for nanometer-scale displacements deteriorates due to difficulty in detecting picometer-scale emission wavelength variations

Engineering Contradiction:

Improvestrain measurement capabilityVSAvoidnanometer-scale displacement measurement precision

Core Design Contradiction:

Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent replaces the conventional emission wavelength detection method with an optical reflection/transmission intensity detection method. Instead of measuring picometer-scale wavelength shifts using spectroscopes, the invention uses a marker with periodic structures that modulate light intensity through reflection or transmission, enabling nanometer-scale displacement measurement with standard detectors.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The invention utilizes changes in optical properties (reflection/transmission intensity) of the marker structure in response to strain-induced deformation. The periodic structure's optical characteristics change as it deforms under strain, creating detectable intensity variations that correspond to nanometer-scale displacements.

Inventive Principle:

Principle #32Color changes

2Adaptability or versatility

If a camera is used to measure strain fields using the moire method, then strain field measurement capability is improved, but measurement precision for nanometer-scale displacements deteriorates due to camera resolution limitations

Engineering Contradiction:

Improvestrain field measurement capabilityVSAvoidnanometer-scale displacement measurement precision

Core Design Contradiction:

Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent replaces camera-based moire method with an optical intensity detection system. Instead of capturing and analyzing grating pattern displacements through camera imaging, the invention directly measures light intensity variations caused by the deformation of periodic marker structures, achieving higher precision with simpler detection hardware.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If the second medium is periodically arrayed in the first medium, then measurement precision is improved through enhanced light interaction, but device complexity increases due to the multi-layer periodic structure

Engineering Contradiction:

Improvestrain measurement precisionVSAvoidmarker structure complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent employs a periodic structure with periodic voids or holes (second medium) arranged in the first medium. This periodic porous structure creates multiple light reflection and transmission paths that enhance sensitivity to deformation while maintaining a relatively simple overall structure that can be fabricated using standard techniques.

Inventive Principle:

Principle #31Porous materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate measurement of strain amounts with nanometer-scale displacements by determining the correspondence between light intensity and strain amounts, reducing environmental and manufacturing errors, and providing constant sensitivity in all directions, thereby enhancing detection accuracy.

Implementation Method 1

the marker is a flat film including a first medium and a second medium having different refractive indexes

Methodology Applied

Scientific EffectRefraction: Refraction

Implementation Method 2

a marker which is disposed on a surface of a measuring object in such a way that the light emitted from the light source is reflected by or transmitted through the marker

Methodology Applied

Scientific EffectReflection: Reflection

Data Source

PatentUS20160252345A1Strain sensor and method of measuring strain amount

Publication Date: 2016.09.01 KONICA MINOLTA INC

AI summary

A strain sensor includes a light source, a marker which is disposed on a measuring object so that light from the light source is reflected by or transmitted through the marker, a detector which detects the intensity of the light from the marker, and a signal processor which calculates a strain amount based on the detected light intensity. The marker is a flat film including first and second media having different refractive indexes. The second medium is periodically arrayed in the first medium and exists simultaneously with the first medium on a plane parallel to the marker mounting surface. The maximum length of the second medium in a direction parallel to the mounting surface is shorter than the wavelength of the emitted light. The first and second media deform in response to load in a direction parallel to the mounting surface.