Strained Transistor Electrostatic Protection Circuit Latch-Up Prevention

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Solution Overview

Problem

The challenge in preventing latch-up effects in electrostatic protection circuits, where strained transistors have improved electron mobility but are prone to damage due to lower breakdown holding voltage, leading to continuous current flow and potential damage when in a breakdown state.

Innovation Solution

An electrostatic protection circuit comprising a strained transistor array and an unstrained transistor, with a control circuit that adjusts impedance between the strained transistor array and ground based on current flow through the unstrained transistor to prevent latch-up and manage current effectively.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If strained transistors are used to improve electron mobility, then electrostatic protection ability is improved, but latch-up effect occurs due to lower breakdown holding voltage

Engineering Contradiction:
Improveelectrostatic protection abilityVSAvoidlatch-up effect
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

An unstrained transistor is introduced as an intermediary component between the strained transistor array and ground. This unstrained transistor has higher breakdown holding voltage and acts as a mediator that prevents direct latch-up in the strained transistors while still allowing electrostatic discharge protection functionality to operate.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the structural parameter of the transistor by using both strained and unstrained transistors with different characteristics. The unstrained transistor's higher breakdown holding voltage parameter compensates for the strained transistor's vulnerability, resolving the latch-up issue while maintaining electron mobility benefits.

Inventive Principle:
Principle #35Parameter changes

2Power

If strained transistor array is used to allow large current flow, then electrostatic discharge protection is improved, but transistor damage occurs due to latch-up effect

Engineering Contradiction:
Improvecurrent flow capabilityVSAvoidtransistor durability
Core Design Contradiction:
PowerVSStrength

Solution Approach 1:

The unstrained transistor serves as a protective intermediary that limits current flow through the strained transistor array. It allows sufficient current for electrostatic protection while preventing excessive current that would cause damage, thus protecting the strained transistors from latch-up induced damage.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The unstrained transistor is positioned beforehand to cushion or limit the current flow through the strained transistor array. This preventive measure ensures that even when large currents flow during electrostatic discharge, the strained transistors are protected from damage by the current-limiting特性 of the unstrained transistor.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

3Reliability

If control circuit is added to manage impedance, then latch-up prevention is improved, but device complexity increases

Engineering Contradiction:
Improvelatch-up preventionVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The control circuit uses the current flowing through the unstrained transistor itself as the control signal to adjust the impedance of the strained transistor array. This self-service mechanism eliminates the need for external control circuits or additional sensing components, preventing latch-up while maintaining simple circuit structure.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The unstrained transistor serves multiple functions: it acts as a current path for electrostatic discharge, a current sensor for control, and a protective element against latch-up. This multi-functionality reduces the need for separate components, thereby limiting the increase in device complexity while achieving reliable latch-up prevention.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively prevents latch-up by dynamically controlling impedance, allowing larger current flow while protecting the strained transistor array from damage, thereby enhancing the electrostatic protection capability and preventing transistor damage.

Implementation Method 1

electron mobility of a transistor of the electrostatic protection circuit is very important. The better the electron mobility of the transistor is, the better the electrostatic protection ability of the electrostatic protection circuit will be

Methodology Applied
Scientific EffectElectron mobility enhancement through strain:

Implementation Method 2

a control circuit electrically connected to a second end of the strained transistor array, a second end of the unstrained transistor and a ground terminal, for controlling impedance between the second end of the strained transistor array and the ground terminal according to current flowing through the unstrained transistor

Methodology Applied
Scientific EffectImpedance control: Electrical Resistance

Data Source

PatentUS8730628B2Electrostatic protection circuit capable of preventing latch-up effect
Publication Date: 2014.05.20 UNITED MICROELECTRONICS CORP
  • US8730628B2 patent drawing
  • US8730628B2 patent drawing
  • US8730628B2 patent drawing

AI summary

An electrostatic protection circuit includes a strained transistor array, an unstrained transistor, and a control circuit. The strained transistor array has a first end electrically connected to a bias terminal. The unstrained transistor has a first end electrically connected to the bias terminal. The control circuit is electrically connected to a second end of the strained transistor array, a second end of the unstrained transistor and a ground terminal. The control circuit controls impedance between the second end of the strained transistor array and the ground terminal according to current flowing through the unstrained transistor. The electrostatic protection circuit is capable of preventing latch-up effect.