Stress-Alleviation Layer for GaN LED Structures

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Solution Overview

Problem

The manufacturing of light emitting diodes (LEDs) on sapphire substrates often results in crystal defects and stress damage due to thermal expansion and lattice constant differences, which can lead to cracking and damage during the dicing process.

Innovation Solution

Incorporating a stress-alleviation layer on the substrate, which is selectively deposited and patterned to form regions and islands that reduce residual stress during epitaxial growth and dicing, allowing for the use of selective epitaxy and potentially increasing light power emission through additional reflective layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If GaN film is grown on sapphire substrate, then LED structure is formed, but crystal defects and cracks occur due to thermal expansion and lattice constant differences

Engineering Contradiction:
Improvestructural integrity of LEDVSAvoidstress damage during dicing
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent introduces stress-alleviation regions that partition the continuous GaN film into separate regions, allowing stress to be managed locally rather than accumulating across the entire structure. This segmentation prevents crack propagation and reduces stress damage during dicing operations.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The stress-alleviation regions act as intermediary elements between the GaN film and the substrate, absorbing and redistributing thermal expansion stresses. These regions serve as a buffer zone that protects the LED structure from harmful stress concentrations during manufacturing processes.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If multiple LEDs are formed on single sapphire substrate and then diced, then manufacturing efficiency is improved, but stress exposure during dicing causes cracking and breakage

Engineering Contradiction:
Improvemanufacturing efficiencyVSAvoidLED structural integrity during dicing
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The stress-alleviation regions create natural segmentation between multiple LED structures on the same substrate. This pre-segmentation allows for easier and safer dicing operations, as the stress pathways are already controlled and separated, reducing the risk of crack propagation during the cutting process.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The stress-alleviation regions are incorporated into the structure before the dicing process, providing预先 cushioning against stress concentrations that would otherwise occur during cutting. This proactive stress management protects the LEDs from damage during subsequent manufacturing steps.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

3Reliability

If stress-alleviation regions are introduced, then residual stress is reduced and stress damage is avoided, but device structure becomes more complex

Engineering Contradiction:
Improvestress damage resistanceVSAvoidLED structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The stress-alleviation regions are strategically placed only in specific locations where stress concentration is most problematic, rather than uniformly throughout the entire structure. This localized approach provides stress relief where needed while maintaining the simplicity of the overall LED design and minimizing additional complexity.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The stress-alleviation layer effectively mitigates stress damage during epitaxial growth and dicing, enhancing the structural integrity and light output of LEDs by reducing crystal defects and improving the manufacturing process efficiency.

Implementation Method 1

a stress-alleviation layer that reduces residual stress and avoids stress damage during epitaxial growth and dicing processes

Methodology Applied
Scientific EffectStress relief: Stress Relaxation

Implementation Method 2

Heteroepitaxial layers are disposed on the substrate at least in the open regions therein, forming an LED structure

Methodology Applied
Scientific EffectHeteroepitaxial growth: Epitaxy

Implementation Method 3

a reflective buffer layer, or an additional reflective layer, may be used, thereby increasing the light power emitted from the non-reflective side of the LED

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS8779445B2Stress-alleviation layer for LED structures
Publication Date: 2014.07.15 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US8779445B2 patent drawing
  • US8779445B2 patent drawing
  • US8779445B2 patent drawing

AI summary

A light emitting diodes (LEDs) is presented. The LED includes a stress-alleviation layer on a substrate. Open regions and stress-alleviation layer regions are formed on the substrate. Epitaxial layers are disposed on the substrate, at least in the open regions therein, thereby forming an LED structure. The substrate is diced through at least a first portion of the stress-alleviation regions, thereby forming the plurality of LEDs.