Stress Compensation Layer for Passivation Stability in Semiconductors

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Solution Overview

Problem

Existing semiconductor devices face challenges in maintaining the reliability of passivation layers under mechanical, thermal, and electrical stresses, which can lead to degradation and reduced performance.

Innovation Solution

The semiconductor device incorporates a stress compensation layer with a defined stress, which is set by adjusting deposition parameters, and additional stress-relieving layers to manage and compensate for stresses within the device.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a passivation layer is used to electrically isolate and protect semiconductor components, then electrical isolation and environmental protection are improved, but the layer becomes susceptible to degradation under mechanical, thermal, and electrical stresses

Engineering Contradiction:
Improvereliability of passivation layerVSAvoidstability of passivation layer under stress
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The patent applies composite materials by creating a multi-layer structure consisting of a passivation layer combined with stress compensation layers. The stress compensation layers are specifically designed with different stress characteristics (tensile or compressive) to counterbalance stresses in the passivation layer, thereby enhancing the overall stability and reliability of the composite structure under mechanical, thermal, and electrical stresses.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent utilizes parameter changes by controlling the deposition parameters (such as RF power, pressure, and temperature) to precisely adjust the stress characteristics of the stress compensation layers. By varying these parameters during the deposition process, the stress in each layer can be optimized to achieve the desired stress compensation effect, improving the passivation layer's resistance to degradation.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If stress compensation layers with defined stress are added to compensate for stresses in the passivation layer, then the stability and reliability of the semiconductor device are improved, but the device complexity increases

Engineering Contradiction:
Improvestability of semiconductor deviceVSAvoidcomplexity of multi-layer structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies segmentation by dividing the stress management function into multiple discrete stress compensation layers, each with specific stress characteristics. Rather than using a single complex layer, the solution segments the compensation function into multiple simpler layers that can be independently optimized and controlled, making the overall system more manageable despite the increased number of components.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances the stability and reliability of the semiconductor device by effectively compensating for thermal and mechanical stresses, thereby improving its performance and longevity.

Implementation Method 1

a first stress compensation layer, which directly adjoins the insulating layer and includes a defined first stress

Methodology Applied
Scientific EffectStress compensation:

Implementation Method 2

a stable stress may be achieved due to the high temperature that is present in this process (approx. 300° C.)

Methodology Applied
Scientific EffectThermal treatment: Heat Treatment

Data Source

PatentUS12206044B2Semiconductor component with a stress compensation layer and a method for manufacturing a semiconductor component
Publication Date: 2025.01.21 AMS OSRAM INT GMBH
  • US12206044B2 patent drawing
  • US12206044B2 patent drawing
  • US12206044B2 patent drawing

AI summary

A semiconductor device may include a conductive layer over a semiconductor body and a first stress compensation layer adjacent to the conductive layer. The stress compensation layer may include a defined first stress.