Stripe Light Depth Measurement for 3D Scanning
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Solution Overview
Problem
Conventional three-dimensional scanning technologies face challenges in accurately measuring the depth of objects with great depth due to malposed or incorrect reorganization of stripe images, leading to errors in depth recovery of three-dimensional images.
Innovation Solution
The method involves projecting a first and second structure light onto an object, capturing images, and detecting image information to determine the sequence and positions of the structure lights, using primary and reference stripe lights with different widths to improve measurement accuracy and avoid misrecognition, thereby enhancing the depth measurement of three-dimensional images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If stripe lights with the same interval and width are projected onto the object, then the three-dimensional scanning system can capture the object surface, but malposed or incorrect reorganization occurs for stripe images with big deflection, affecting depth recovery accuracy
Solution Approach 1:
The patent applies local quality by making different parts of the stripe light structure have different widths. Specifically, reference stripe lights have different widths than primary stripe lights, creating local variations in the stripe pattern. This allows the recognition system to distinguish between different stripe lights even when they undergo large deflections, thereby improving both measurement precision and reliability for deep objects.
Solution Approach 2:
The patent changes the parameter of stripe light width to improve recognition accuracy. By varying the width of reference stripe lights relative to primary stripe lights, the system creates distinctive patterns that can be reliably identified even when stripe images experience big deflections. This parameter change directly addresses the contradiction by maintaining recognition accuracy while enabling accurate depth recovery.
2Area of stationary object
If the object is at greater depth, then the three-dimensional scanning coverage is improved, but the deflection of stripe image increases causing malposed recognition
Solution Approach 1:
The patent uses local quality by introducing stripe lights with different widths at specific locations. Reference stripe lights have different widths than primary stripe lights, creating local distinctive features. This allows the system to maintain recognition capability even when scanning deep objects that cause large stripe image deflections, thereby expanding scanning coverage without sacrificing recognition difficulty.
Solution Approach 2:
The patent changes the width parameter of stripe lights to facilitate detection at greater depths. By creating reference stripe lights with different widths, the system provides distinctive markers that can be reliably detected and measured even when the object is at greater depth and the stripe images undergo significant deflection, thus reducing recognition difficulty.
3Measurement precision
If multiple stripe lights are projected to improve depth measurement, then the depth information becomes more comprehensive, but the sequence and position recognition becomes more complex
Solution Approach 1:
The patent applies local quality by assigning different widths to reference stripe lights compared to primary stripe lights. This creates local distinctive characteristics within the multiple stripe lights, making it easier to recognize their sequences and positions. The different widths serve as natural identifiers that simplify the recognition process while maintaining comprehensive depth measurement capability.
Solution Approach 2:
The patent changes the width parameter of stripe lights to reduce recognition complexity. By making reference stripe lights have different widths than primary stripe lights, the system creates easily distinguishable patterns that simplify the task of recognizing stripe sequences and positions, thereby reducing overall system complexity while improving depth measurement accuracy.
Data Source
AI summary
A method for processing data and an apparatus thereof are provided. The method includes: projecting a first structure light and a second structure light onto a surface of a target object, wherein the first structure light is a stripe-structure light; capturing a first image comprising the target object; detecting first image information corresponding to the first structure light in the first image, wherein the first image information is stripe image information; detecting second image information corresponding to the second structure light in the first image; and obtaining a depth of the target object based on the first image information and the second image information.