Stripped EMIB Layout for Lower-Layer Package Interconnect
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Solution Overview
Problem
Integrated circuit miniaturization faces challenges due to package real estate constraints during interconnecting, where existing technologies struggle to optimize the layer count and signal referencing in integrated-circuit device packages.
Innovation Solution
The implementation of a stripped embedded multi-die interconnect bridge (sEMIB) is seated just below the top solder-resist layer, fabricated on a glass substrate, and then stripped, allowing for a low Z-height and thinner upper dielectric layers, which reduces the package-layer count from 4-2-4 to 3-2-3, enhancing signal referencing and saving valuable interconnect layers.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional multi-layer package substrate is used, then signal referencing and interconnect capacity are improved, but package real estate consumption and device complexity increase
Solution Approach 1:
The patent extracts the interconnect bridge function from the traditional multi-layer substrate architecture by implementing a stripped EMIB (embedded multi-die interconnect bridge) structure. This removes the need for extensive substrate layers dedicated to interconnecting, as the bridge is now a separate, optimized component that can be precisely positioned and connected to dies, thereby reducing overall package real estate while maintaining signal integrity.
Solution Approach 2:
The patent transitions from a planar, two-dimensional substrate layout to a three-dimensional stacked architecture using the stripped EMIB. By vertical stacking of dies interconnected through the EMIB bridge, the design achieves higher interconnect capacity and better signal referencing without proportionally increasing the package footprint, effectively utilizing the Z-dimension to reduce real estate consumption.
2Device complexity
If package layer count is reduced, then manufacturing complexity and cost are decreased, but signal referencing quality may deteriorate
Solution Approach 1:
The patent applies local quality by concentrating signal referencing resources at critical locations rather than distributing them uniformly across multiple substrate layers. The stripped EMIB provides localized, high-quality signal referencing exactly where needed at the die-EMIB interface, eliminating the need for extensive substrate routing layers while maintaining or improving signal integrity through precision-aligned interconnections.
Solution Approach 2:
The stripped EMIB acts as an intermediary component between the substrate and the dies, providing superior signal referencing functionality that eliminates the need for complex multi-layer substrate routing. This mediator structure offers controlled impedance pathways and dedicated reference planes directly at the interconnect interface, achieving better signal quality with fewer overall layers.
3Area of stationary object
If stripped EMIB is implemented, then package real estate is optimized and signal referencing is improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent applies preliminary action by pre-fabricating the stripped EMIB structure with integrated alignment features and reference marks before die attachment. The EMIB is prepared in advance with precisely positioned vias, traces, and bond pads, allowing for accurate alignment during subsequent die bonding processes. This pre-preparation reduces the precision burden during final assembly by providing built-in registration mechanisms.
Data Source
AI summary
An embedded multi-die interconnect bridge (EMIB) is fabricated on a substrate using photolithographic techniques, and the EMIB is separated from the substrate and placed on the penultimate layer of an integrated-circuit package substrate, below the top solder-resist layer. A low Z-height of the EMIB, allows for useful trace and via real estate below the EMIB, to be employed in the package substrate.


