Structural Degradation Detection via Deflection-Displacement Feature Analysis

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Solution Overview

Problem

Existing methods for determining the degradation state of structures, such as bridges and tunnels, rely on either deflection amount or surface distortion, leading to inaccurate inspections as they do not consider the relationship between these two factors.

Innovation Solution

A state determination apparatus and method that measures both deflection amount and surface displacement in multiple target regions, calculates feature values indicating their relationship, and determines the degradation state based on the spatial distribution of these values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If only deflection amount is used to detect abnormality, then the inspection method is simple, but the detection accuracy is insufficient

Engineering Contradiction:
Improveinspection method complexityVSAvoiddetection accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent combines multiple measurement parameters (deflection amount and surface displacement amount) into a unified inspection system. By merging these different types of data and analyzing their relationships, the system achieves higher detection accuracy while maintaining reasonable complexity through integrated processing.

Inventive Principle:
Principle #5Merging (Combining)

2Device complexity

If only surface distortion is measured to assess fatigue, then the measurement process is simple, but the inspection accuracy is insufficient

Engineering Contradiction:
Improvemeasurement process complexityVSAvoidinspection accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent merges surface displacement measurement with deflection amount measurement, combining two previously separate simple measurement approaches into an integrated system that achieves superior inspection accuracy through the analysis of relationships between the measurements.

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If both deflection amount and surface distortion are used for inspection, then the detection accuracy improves, but the complexity of conducting an appropriate inspection increases

Engineering Contradiction:
Improvedetection accuracyVSAvoidinspection complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent transforms the inspection approach by changing from analyzing individual parameters separately to analyzing the relationship between parameters. By calculating feature values that represent the relationship between deflection amount and surface displacement amount, the system manages complexity through parameter transformation and spatial distribution analysis.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11365963B2State determination apparatus, state determination method, and computer-readable recording medium
Publication Date: 2022.06.21 NEC CORP
  • US11365963B2 patent drawing
  • US11365963B2 patent drawing
  • US11365963B2 patent drawing

AI summary

A state determination apparatus 100 determines the state of a structure 200. The state determination apparatus 100 includes a measurement unit 10 configured to measure a deflection amount and a surface displacement amount in each of a plurality of target regions that are preset on the structure 200, a feature value calculation unit 20 configured to calculate, for the respective target regions, feature values each indicating a relationship between the deflection amount and the surface displacement amount, using the measured deflection amount and surface displacement amount, a spatial distribution calculation unit 30 configured to calculate a spatial distribution of the feature values using the feature values calculated for each of the target regions, and a degradation state determination unit 40 configured to determine a degradation state of the structure 200 based on the spatial distribution of the feature value.