Structured Illumination 3D Imaging Depth Sectioning
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Solution Overview
Problem
Current non-contact surface characterization methods face challenges in achieving high-resolution, fast, and environmentally robust three-dimensional imaging of objects, particularly in manufacturing and medical applications, due to limitations in depth sectioning capabilities and sensitivity to environmental perturbations.
Innovation Solution
The method involves directing a structured illumination pattern to the best-focus surface of an imaging optic, using a spatial light modulator to modulate light intensity, and acquiring a series of images while scanning the object. This approach allows for the derivation of three-dimensional images by analyzing the modulation signals, which can emulate scanning low-coherence interferometer signals, and provides enhanced imaging with features like color and texture information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional non-contact surface characterization methods are used, then three-dimensional imaging can be obtained, but the depth sectioning capability is limited and sensitivity to environmental perturbations is high
Solution Approach 1:
The patent applies periodic modulation of illumination intensity at each pixel location across a sequence of images. By modulating the illumination pattern and analyzing the temporal frequency content of the reflected light signal, the system achieves enhanced depth sectioning capability and reduced sensitivity to environmental noise, effectively resolving the contradiction between measurement precision and environmental sensitivity
Solution Approach 2:
The system dynamically adjusts the illumination modulation frequency and analyzes the temporal dynamics of the reflected signal at each pixel. This dynamic approach allows the system to distinguish between static environmental perturbations and dynamic surface features, improving depth sectioning while maintaining robustness against environmental variations
2Productivity
If structured illumination modulation is applied to enable fast autofocus scan, then imaging speed is improved, but the system complexity increases
Solution Approach 1:
The patent replaces traditional mechanical autofocus scanning mechanisms with optical modulation and computational analysis. By using structured illumination patterns and analyzing the temporal frequency content of reflected light, the system achieves fast autofocus capability without complex mechanical moving parts, thus improving imaging speed while managing system complexity
Solution Approach 2:
The system introduces an intermediary computational processing stage that analyzes the modulated illumination signals. This intermediary layer enables fast autofocus scanning by extracting depth information from the temporal modulation characteristics, achieving high imaging speed without requiring complex mechanical scanning systems
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables high-resolution, fast, and robust non-contact three-dimensional imaging with reduced sensitivity to environmental noise, comparable to confocal microscopy, and offers advantages in depth sectioning and source brightness requirements, suitable for applications like laser eye surgery and manufacturing.
Implementation Method 1
directing a structured illumination pattern to a surface of best-focus of an imaging optic while imaging a field in the surface of best-focus onto a multi-element detector. A structured illumination pattern is a non-uniform illumination pattern that contains some form of encoding based on light intensity.
Implementation Method 2
directing a structured illumination pattern to a surface of best-focus of an imaging optic while imaging a field in the surface of best-focus onto a multi-element detector
Implementation Method 3
imaging a field in the surface of best-focus onto a multi-element detector. The resulting signal acquired at each detector element has a modulation
Data Source
AI summary
Methods for forming a three-dimensional image of a test object include directing light to a surface of best-focus of an imaging optic, where the light has an intensity modulation in at least one direction in the surface of best-focus, scanning a test object relative to the imaging optic so that a surface of the measurement object passes through the surface of best-focus of the imaging optic as the test object is scanned, acquiring, for each of a series of positions of the test object during the scan, a single image of the measurement object using the imaging optic, in which the intensity modulation of the light in the surface of best-focus is different for successive images, and forming a three-dimensional image of the test object based on the acquired images.