Structured Illumination Imaging System for Subpixel Resolution
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Solution Overview
Problem
Current CMOS imaging technology is limited by the pitch of the sensor system, restricting the ultimate pitch and data density of information. Traditional structured illumination microscopy systems face challenges in detecting molecules due to the need to recollect and reimagine excitation light, which decreases signal and introduces aberrations.
Innovation Solution
A structured illumination imaging system that uses an active pixel sensor in the active plane of a patterned sample, where the sample is aligned over the image sensor such that each pixel has a plurality of patterned features. The system projects a plurality of fringes onto the sample, with the fringe width being at least equal to the dimension of the features but less than the pitch of the pixels, allowing for increased image resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional structured illumination microscopy is used to increase lateral resolution, then image resolution is improved, but signal loss and aberrations occur due to the need to recollect and reimage excitation light
Solution Approach 1:
Instead of using a conventional microscope objective to both illuminate and detect (recollect and reimage light), this patent inverts the approach by placing the image sensor directly in the illumination plane. The sensor detects light directly from the sample features without requiring recollection through optical paths, thereby eliminating signal loss and aberrations while maintaining super-resolution capabilities through structured illumination patterns
Solution Approach 2:
The patent extracts the detection function from the conventional optical path and places it directly in the illumination plane. By removing the need for light recollection and reimaging through the objective lens, the system eliminates the associated signal loss and optical aberrations while preserving the structured illumination capability for super-resolution imaging
2Quantity of substance
If the pitch of sensor pixels is reduced to increase data density, then information capacity is improved, but manufacturing complexity increases due to fabrication constraints
Solution Approach 1:
The patent resolves the pitch limitation by introducing a spatial dimension through structured illumination patterns. Instead of relying solely on smaller pixel pitch to increase data density, the system uses patterned illumination to encode additional spatial information, effectively increasing the information capacity without requiring further reduction in physical pixel dimensions
Solution Approach 2:
The patent changes the illumination parameter from uniform to structured (patterned) light. This parameter change enables the system to achieve higher effective data density by encoding spatial information in the illumination pattern itself, rather than relying exclusively on reducing the physical pitch of sensor pixels
3Measurement precision
If multiple images are acquired at various pattern phases to achieve extended spatial frequency bandwidth, then image resolution is improved, but acquisition time and complexity increase
Solution Approach 1:
The patent merges the illumination and detection functions into a single plane, allowing structured illumination patterns to directly modulate the signal detected by each pixel. This combination enables the system to achieve extended spatial frequency bandwidth more efficiently by capturing spatial information directly at the sensor plane rather than requiring multiple sequential images through conventional optical reimaging
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances image resolution by spatially multiplexing data from each pixel using structured illumination, achieving subpixel resolution without the limitations of traditional systems. It also allows for increased signal gain and reduced costs, as the image sensor is an active pixel sensor like CMOS.
Implementation Method 1
an optical element to diffract light emitted by the light emitter to project a plurality of fringes on a plane of a sample
Data Source
AI summary
The disclosure provides a structured illumination imaging system that utilizes an image sensor (e.g., an active pixel sensor) in an active plane of a patterned sample to increase image resolution. The imaged sample may be patterned and/or aligned over an image sensor such that each light sensor (e.g., pixel) of the image sensor has a respective plurality of features formed and/or mounted above it. In response to illumination, each of the features may emit fluorescent light that is collected by a pixel of the image sensor. During imaging, each pixel of the image sensor may be spatially multiplexed using structured illumination such that only a subset (e.g., one or two) of the features aligned over the pixel are illuminated with structured light during an image read.