Structured Light Depth Sensor Adaptive Scan Control

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Solution Overview

Problem

Current depth information measuring technologies require significant computing resources and processing time, especially when measuring multiple objects, as they need to scan the entire image with a fixed scan frequency and resolution, which becomes inefficient when only a few objects are moving.

Innovation Solution

A method and apparatus that dynamically adjust the scan area, frequency, resolution, and pattern of structured light based on the location of moving objects, allowing for prioritized processing of depth information in areas with movement, thereby reducing unnecessary calculations and increasing processing speed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If the entire image is scanned with fixed scan frequency and resolution, then measurement coverage is complete, but processing time and computing resources increase significantly

Engineering Contradiction:
Improvescan areaVSAvoidprocessing time
Core Design Contradiction:
Area of stationary objectVSLoss of time

Solution Approach 1:

The patent applies local quality by differentiating processing intensity across different regions of the image. Static regions undergo lower-resolution or less frequent scanning, while dynamic regions (containing moving objects) receive higher-resolution or more frequent scanning. This regional differentiation reduces overall processing time while maintaining measurement quality where needed.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the image into static and dynamic regions based on motion detection. By dividing the scanning task into different regions with different processing requirements, the system avoids uniformly high-resolution scanning of the entire image, thereby reducing computing resources and processing time for static areas.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If scan frequency and resolution are increased to improve measurement accuracy, then depth information precision improves, but computing resources and processing time increase significantly

Engineering Contradiction:
Improvedepth information accuracyVSAvoidprocessing efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent implements local quality by applying different scan frequencies and resolutions to different regions. High scan frequency and resolution are applied only to regions containing moving objects where high measurement precision is needed, while static regions use lower scan frequency and resolution, thus improving productivity without sacrificing necessary measurement accuracy.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent makes the scanning parameters dynamic by adjusting scan frequency and resolution based on detected motion. The system transitions from static uniform scanning to dynamic adaptive scanning, where parameters change according to the presence and location of moving objects, optimizing the balance between precision and productivity.

Inventive Principle:
Principle #15Dynamics

3Measurement precision

If high scan resolution is applied to the entire image, then depth information accuracy improves, but computing resources consume more

Engineering Contradiction:
Improvedepth information accuracyVSAvoidcomputing resources
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent applies local quality by restricting high-resolution scanning only to regions containing moving objects. Static regions are scanned at lower resolution or skipped entirely, significantly reducing computing resource consumption while maintaining high depth information accuracy where motion is detected.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent uses partial action by applying high scan resolution only partially—to specific regions with moving objects—rather than excessively applying it to the entire image. This selective approach reduces computing resource usage while achieving sufficient measurement precision for dynamic regions.

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach saves scan time, increases processing speed, and enhances scan resolution within the same processing time by focusing computational resources on areas with moving objects, while reducing them in static areas.

Implementation Method 1

a structured light with a scan pattern is projected by a light projecting device to scan at least one object, and a reflected light from the at least one object is detected by a light sensing device, and depth information of each of the at least one object is calculated according to a deformation of a reflective pattern of the reflected light

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS10008001B2Method and apparatus for measuring depth information
Publication Date: 2018.06.26 WISTRON CORP
  • US10008001B2 patent drawing
  • US10008001B2 patent drawing
  • US10008001B2 patent drawing

AI summary

A method and an apparatus for measuring depth information are provided. In the method, a structured light with a scan pattern is projected by a light projecting device to scan at least one object. Reflected light from the object is detected by a light sensing device, and depth information of each object is calculated according to a deformation of a reflective pattern of the reflected light. Then, images of the object are captured by an image capturing device and used to obtain location information of each object. At least one moving object is found among the objects according to a change of the location information. Finally, at least one of a scan area, a scan frequency, a scan resolution and the scan pattern of the structured light and an order for processing data obtained from scanning is adjusted so as to calculate the depth information of each object.