Structured Light Depth Measurement Using Dynamic Beam Scanning
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Solution Overview
Problem
Existing structured light methods for measuring depth information are limited by the lateral resolution and pixel density of projected patterns, which restricts the achievable spatial and depth resolution, and require movement of the camera or object to gather more information.
Innovation Solution
A method using a parallel radiation source with a microscanner to time-dependently align and image the electromagnetic beam, creating a dynamic irradiation pattern that improves resolution without moving the camera or object, by exploiting the beam's trajectory and using non-reproducing trajectories like Lissajous or spiral figures to ensure comprehensive coverage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a predefined pattern (dots or stripes) is projected onto the scene, then depth information can be determined by triangulation, but the lateral resolution and pixel density are limited by the projected pattern
Solution Approach 1:
The patent applies dynamics by replacing static projected patterns with dynamic beam scanning. The radiation detector and/or radiation source move relative to the scene, continuously scanning the beam across different locations. This dynamic approach allows the system to gather depth information from multiple positions without requiring a complex static pattern, thereby improving lateral resolution while maintaining measurement precision through temporal sequencing of the scanning data.
2Loss of information
If the projected pattern is made finer with closer dots or stripes, then more information or pixels can be determined, but the system requires movement of the camera structure or object to illuminate new aspects
Solution Approach 1:
The patent replaces the mechanical movement of cameras or objects with a focused beam scanning system. Instead of moving entire camera structures to capture different aspects of the scene, a concentrated radiation beam is scanned across the scene using a radiation detector and/or source that can be precisely positioned. This substitution reduces mechanical complexity while maintaining the ability to gather comprehensive information about the scene from multiple viewpoints.
3Device complexity
If a non-modulated laser is used with beam scanning, then pixel modulation hardware is eliminated, but the system must rely on time-dependent sequential alignment to create the irradiation pattern
Solution Approach 1:
The patent employs periodic action through time-dependent sequential alignment of the beam. The radiation detector and/or source scan the beam in a systematic, repeating pattern across the scene, creating an irradiation pattern over time. This periodic scanning approach allows the system to build up complete depth information through multiple passes, compensating for the elimination of pixel modulation hardware while maintaining efficient data acquisition.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the level of detail in depth information measurement, reduces data processing requirements, and allows for higher resolution without the need for pixel modulation, using a non-modulated laser and adaptive scanning to achieve efficient and precise 3D imaging.
Implementation Method 1
generating a respective electromagnetic beam by means of at least one parallel radiation source
Implementation Method 2
deflecting the respective beam on at least one microscanner, with at least one respective MEMS mirror
Implementation Method 3
detecting, at least in portions, of an image representation of the irradiation pattern generated by an at least partial reflection of the irradiation pattern at one or more surfaces
Data Source
AI summary
Methods and device for measuring depth information relating to a scene on the basis of structured light generated by means of at least one parallel radiation source, wherein the method comprises: generating a respective electromagnetic beam by means of at least one parallel radiation source; time-dependent sequential aligning or optically imaging the beam or at least one of the beams on different locations, in particular punctiform or line segment-shaped locations of a three-dimensional scene in order to irradiate the scene by means of the at least one imaged beam in the form of an irradiation pattern defined by the trajectory of the beam arising from the time-dependent alignment or imaging of the beam; detecting, at least in portions, an image representation of the irradiation pattern generated by an at least partial reflection of the irradiation pattern at one or more surfaces of at least one object present in the scene (namely, a physical object), and generating image information representing the detected image representation of the irradiation pattern; and evaluating the image information in order to calculate depth information in relation to the scene on its basis.