Structured Light Pattern Removal in Infrared Imaging
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Solution Overview
Problem
Electronic devices using structured light for infrared imaging face challenges in obtaining high-quality images due to pattern distortion, which can be exacerbated by the need for additional auxiliary light sources, leading to issues with mounting space, cost, and power consumption.
Innovation Solution
An electronic device equipped with a light source emitting light outside the visible spectrum, a camera system to capture images with deformed patterns, and a processor that removes the pattern distortion using stored pattern information and disparity maps, allowing for simultaneous infrared and visible light image capture without additional light sources.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an auxiliary light source is added to acquire high-quality infrared images, then image quality is improved, but mounting space, cost, and power consumption increase
Solution Approach 1:
The patent extracts and removes the structured light pattern from the captured image through image processing techniques. By separating the pattern information from the actual scene information, the system achieves high-quality infrared imaging without requiring additional auxiliary light sources, thereby reducing device complexity while maintaining measurement precision
Solution Approach 2:
The patent converts the harmful effect of structured light pattern distortion into a beneficial feature by using the pattern deformation itself as depth information. The system analyzes how the known structured light pattern deforms when reflected from the scene, and uses this deformation to both remove the pattern and generate depth maps, transforming a problem into a solution
2Measurement precision
If structured light is used to obtain depth information, then depth measurement capability is improved, but pattern distortion in images occurs
Solution Approach 1:
The patent segments the captured image into different components: the structured light pattern, the actual scene information, and the depth information. By separating these elements through image processing, the system preserves depth measurement capability while removing pattern distortion from the final image, allowing both depth information and clean images to coexist
Solution Approach 2:
The patent employs feedback mechanisms where the captured deformed pattern is analyzed and used to generate correction information. This feedback loop allows the system to continuously refine the removal of pattern distortion while preserving the depth information encoded in the pattern deformation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables high-quality infrared image acquisition without auxiliary light sources, improving image quality and reducing device costs and power consumption while enhancing depth information and object recognition capabilities.
Implementation Method 1
a light source configured to allow light, excluding a visible light band, to be incident on a specified pattern
Implementation Method 2
a camera configured to receive the light, which is incident from the light source and reflected by an external object
Data Source
AI summary
According to various embodiments of the present invention, an electronic device can comprise: a light source configured to allow light, excluding a visible light band, to be incident on a designated pattern; a memory for storing designated pattern information; a camera configured to receive the light, which is incident from the light source and reflected by an external object; and a processor. The processor can be configured to: acquire a first image on an external object by using a camera, wherein the first image includes a pattern formed when the designated pattern is deformed by a curve of the surface of the external object; extract deformed pattern information from the first image by using the first image and the designated pattern information; and generate a second image from which the pattern deformed in the first image has been removed, by using the first image and the extracted deformed pattern information. Additional various embodiments are possible.