Structured-Light Detector for Distance-Independent Material Classification

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Solution Overview

Problem

Existing material identification methods struggle with reliable classification and identification of materials due to features that depend on distance and material, particularly in reflective modes, leading to unreliable results, especially for translucent materials.

Innovation Solution

A detector system utilizing a matrix of optical sensors with distance and material-dependent image filters to analyze reflection images, determining distance and material properties by applying depth-from-photon-ratio and depth-from-defocus filters, enabling accurate material classification.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If beam profile analysis is used for material identification in reflective mode, then material classification is possible, but the features depend on both distance and material making reliable identification impossible

Engineering Contradiction:

Improvematerial identification reliabilityVSAvoidfeature separation

Core Design Contradiction:

ReliabilityVSLoss of information

Solution Approach 1:

The patent segments the beam profile analysis into two independent components: distance features extracted through depth-from-photon-ratio and depth-from-defocus filters, and material features extracted through material-dependent image filters. This segmentation separates the coupled distance-material information into distinct features, allowing reliable material identification independent of distance variations.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent introduces distance compensation as an intermediary step that corrects the beam profile data for distance effects before material analysis. By applying depth estimation results to compensate distance-related variations in the beam profile, the system isolates the material-specific features from distance-dependent artifacts.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Reliability

If wavelength larger than 1000 nm is used for reflective mode material identification, then reliable results are obtained, but device complexity and resource requirements increase

Engineering Contradiction:

Improvematerial identification accuracyVSAvoidsystem complexity

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The patent changes the analytical parameters rather than the physical wavelength parameters. Instead of using wavelengths >1000 nm to achieve material differentiation, the system uses standard wavelengths combined with advanced image filtering techniques (depth-from-photon-ratio, depth-from-defocus, and material-dependent filters) to extract material features. This parameter change maintains reliability while reducing device complexity.

Inventive Principle:

Principle #35Parameter changes

Solution Approach 2:

The patent substitutes the mechanical/optical approach (using specific wavelengths to achieve material differentiation) with an information processing approach (using image filters and algorithms to extract material features). This replacement of physical wavelength selection with computational analysis reduces hardware complexity while maintaining identification accuracy.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Reliability

If through beam mode is used for material classification, then reliable identification is achieved, but the method is not applicable to translucent materials and requires specific geometric arrangements

Engineering Contradiction:

Improvematerial classification accuracyVSAvoidmaterial type applicability

Core Design Contradiction:

ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent creates a universal beam profile analysis system that works for both translucent and non-translucent materials through reflective mode. By using image filters that extract material features from reflected light patterns rather than transmitted light, the system achieves multi-functionality across different material types without requiring geometric changes or mode switching.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system provides reliable identification of material properties with low technical effort and resource requirements, effectively distinguishing between various materials including biological tissues and inorganic surfaces.

Implementation Method 1

recording at least one reflection image of a light beam originating from at least one object

Methodology Applied

Scientific EffectReflection: Reflection

Implementation Method 2

determining at least one distance feature φ1z by applying at least one distance dependent image filter φ1 to the reflection image, wherein the distance dependent image filter is at least one filter selected from the group consisting of: a depth-from-photon-ratio filter

Methodology Applied

Scientific EffectPhoton ratio depth estimation:

Implementation Method 3

a depth-from-defocus filter

Methodology Applied

Scientific EffectDefocus: Depth of Field

Data Source

PatentUS12461238B2Detector for identifying at least one material property

Publication Date: 2025.11.04 TRINAMIX GMBH

AI summary

Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.