Structured Light Modulation for 3D Printing Resolution
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Solution Overview
Problem
Current measuring systems for 3D printing have insufficient resolution, making it difficult to monitor topography and height variations of 3D objects and measure the flatness of spread powder, which affects the quality and yield of the objects.
Innovation Solution
A structured light generating device that modulates a projection light beam into a first structured light beam and shifts it to create a second beam with a pattern difference, forming a superimposed beam for improved resolution, used in conjunction with an image capturing device to analyze the 3D object's height variations and powder flatness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a current available measuring system is used to measure 3D objects, then the measurement process can be performed, but the resolution is insufficient making it difficult to monitor topography and height variation
Solution Approach 1:
The patent divides a single light beam into multiple structured light beams (first structured light beam and second structured light beam) with different shift amounts. By segmenting the measurement into multiple beams that are later synthesized, the system achieves higher measurement resolution and precision for monitoring topography and height variation of 3D objects.
Solution Approach 2:
The patent introduces an additional dimension by creating multiple structured light beams with different spatial shifts rather than using a single beam. This multi-dimensional approach allows for more precise measurement of height variation and topography by comparing the synthesized information from multiple beam perspectives.
2Measurement precision
If a current available measuring system performs multiple operations to capture images of multiple surfaces, then height variation can be obtained, but the process is time-consuming
Solution Approach 1:
The patent merges multiple structured light beams (first and second beams) into a synthesized structured light beam that contains information from all beams. This combining approach allows the system to obtain comprehensive height variation data more efficiently than sequential single-beam measurements, improving measurement speed while maintaining precision.
Solution Approach 2:
The patent performs preliminary actions by pre-calculating and pre-positioning multiple structured light beams with different shift amounts before the actual measurement. This preparation allows the synthesized beam to immediately provide accurate height variation data without requiring multiple sequential operations during the measurement process itself.
3Measurement precision
If image defect algorithms such as SVD or HHT are used to analyze powder flatness, then background information can be obtained, but a large number of data operations are required
Solution Approach 1:
The patent performs preliminary action by embedding reference information directly into the structured light beams through the light modulating element. The synthesized beam contains pre-encoded background information and reference patterns that simplify subsequent analysis, reducing the need for complex data operations like SVD or HHT while maintaining accurate powder flatness measurement capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances the resolution of measurements, reducing the number of image capturing operations needed and improving the quality and yield of 3D printed objects by accurately analyzing height variations and powder flatness.
Implementation Method 1
a light modulating element configured to receive a projection light beam and modulate the projection light beam into a first structured light beam having a pattern
Implementation Method 2
a light shifting element corresponding to the light modulating element and configured to receive and shift the first structured light beam to generate a second structured light beam having the pattern, wherein a shift difference exists between the first structured light beam and the second structured light beam
Implementation Method 3
the first structured light beam and the second structured light beam are superimposed to form a superimposed structured light beam
Data Source
AI summary
A structured light generating device and a measuring system and method are provided. The structured light generating device includes: a light modulating element for receiving a projection light beam and modulating the projection light beam into a first structured light beam having a pattern, and a light shifting element corresponding to the light modulating element for receiving and shifting the first structured light beam to generate a second structured light beam having the pattern. A shift difference is formed between the first structured light beam and the second structured light beam, and the first structured light beam and the second structured light beam are superimposed to form a superimposed structured light beam so as to improve resolution.