Structured Light Pose Optimization for 3D Defocus Calibration

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Solution Overview

Problem

Existing structured light three-dimensional measurement methods face difficulties in adjusting the defocus amount of the system to achieve an appropriate defocus level, leading to insufficient measurement accuracy.

Innovation Solution

A method and apparatus for structured light systems that utilize system pose optimization, involving intrinsic and extrinsic parameter calibration, capture sinusoidal fringe images, determine defocus phase undetermined coefficients, and adjust the system pose based on a mathematical model to construct a three-dimensional model using triangulation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If defocus projection technology is used with binary fringe patterns, then the measurement system can be implemented, but the measurement accuracy is insufficient due to inability to adjust defocus amount

Engineering Contradiction:
Improvethree-dimensional measurement accuracyVSAvoiddefocus amount adjustment
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent changes the parameter of defocus amount from a fixed system characteristic to an adjustable variable. By introducing a defocus amount adjustment mechanism, the system can dynamically modify the defocus parameter to achieve optimal measurement accuracy for different measurement scenarios, directly resolving the contradiction between measurement precision and ease of operation.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent transforms the static defocus projection system into a dynamic one by enabling real-time adjustment of the defocus amount. This allows the system to adapt to different measurement requirements by changing the defocus level, thereby improving both measurement accuracy and operational flexibility.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If the defocus amount is not adjustable, then the system structure remains simple, but the measurement accuracy becomes insufficient

Engineering Contradiction:
Improvethree-dimensional measurement accuracyVSAvoidsystem structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces a defocus amount adjustment mechanism that allows the defocus parameter to be changed without fundamentally redesigning the system architecture. This minimal structural addition enables precise control over the defocus level, achieving high measurement accuracy while maintaining relative system simplicity.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces complex mechanical adjustment mechanisms with a more streamlined approach, using optical parameter control to achieve defocus adjustment. This substitution reduces mechanical complexity while maintaining the ability to precisely control measurement accuracy.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Achieves high-precision three-dimensional measurement by optimizing the system pose, ensuring accurate adjustment of defocus levels.

Implementation Method 1

combining the phase information and calibrated system parameters, the height and three-dimensional information of the measured object is acquired by using the triangulation principle

Methodology Applied
Scientific EffectTriangulation:

Implementation Method 2

When performing defocus projection of the binary fringe patterns, the defocus effect of the projection system is regarded as a low-pass filter

Methodology Applied
Scientific EffectDefocus effect: Depth of Field

Data Source

PatentUS20250354804A1Three-dimensional measurement method and apparatus for structured light system based on system pose optimization
Publication Date: 2025.11.20 GUANGDONG UNIV OF TECH
  • US20250354804A1 patent drawing
  • US20250354804A1 patent drawing
  • US20250354804A1 patent drawing

AI summary

A three-dimensional measurement method and apparatus for a structured light system based on system pose optimization is provided. The method includes acquiring multiple binary fringe modulations and performing intrinsic and extrinsic parameter calibration of a projector and a camera by using a preset visual positioning method to determine an initial inter-optical-center horizontal distance; calculating system distance magnification data based on each sinusoidal fringe image and the initial inter-optical-center horizontal distance; determining defocus phase undetermined coefficients based on each binary fringe modulation; applying a preset system pose optimization mathematical model to determine a target inter-optical-center horizontal distance based on the initial inter-optical-center horizontal distance, the system distance magnification data, and the defocus phase undetermined coefficients; and adjusting the system pose of the structured light system based on the target inter-optical-center horizontal distance, and constructing a three-dimensional model of an object to be measured based on the triangulation method.