Structured Light Projection Module Speckle Pattern Uniformity

The patent divides a single light source system into multiple sub-light sources (e.g., multiple VCSELs or LED arrays) arranged in specific patterns. Each sub-light source generates its own speckle pattern through a corresponding DOE, and these patterns are superimposed to form the final structured light pattern. This segmentation improves density distribution uniformity and enhances non-correlation properties.

The patent employs multiple DOEs with different diffraction characteristics or multiple light sources with different spectral properties to generate composite structured light patterns. The superposition of patterns from different sources creates improved non-correlation and more uniform density distribution while maintaining system functionality.

The patent implements dynamic control of multiple sub-light sources, where not all sources operate continuously. Instead, different subsets of sub-light sources are activated based on the required field-of-view and projection requirements. This dynamic activation strategy maintains high projection performance while reducing overall power consumption by keeping only necessary sources active at any given time.

The patent uses a larger array of sub-light sources than strictly necessary for minimum functionality, but operates only a partial subset of these sources simultaneously. This allows the system to achieve high field-of-view and improved pattern distribution when needed, while consuming less power by activating only the required number of sources for each specific application scenario.

The patent divides the light emission into multiple sub-light sources, each operating at lower intensity individually. When their speckle patterns are superimposed, the overall pattern contrast is sufficient for accurate depth calculation, but no single source reaches the intensity levels that cause hazardous zero-order diffraction effects, thereby improving safety.

The patent merges multiple low-intensity light sources to achieve the effective pattern contrast needed for accurate measurement. The combined effect of multiple diffuse speckle patterns provides sufficient signal strength for calculation accuracy without the concentrated high intensity that creates laser safety hazards from zero-order diffraction.